{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T11:12:36Z","timestamp":1725448356235},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/idt.2011.6123095","type":"proceedings-article","created":{"date-parts":[[2012,1,11]],"date-time":"2012-01-11T22:00:45Z","timestamp":1326319245000},"page":"18-23","source":"Crossref","is-referenced-by-count":0,"title":["Analog performance prediction based on archimedean copulas generation algorithm"],"prefix":"10.1109","author":[{"given":"Kamel","family":"Beznia","sequence":"first","affiliation":[]},{"given":"Ahcene","family":"Bounceur","sequence":"additional","affiliation":[]},{"given":"Reinhardt","family":"Euler","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990318"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.41"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2149522"},{"key":"ref13","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4757-3076-0","article-title":"An Introduction to Copulas","author":"nelsen","year":"1999","journal-title":"Lecture Notes in Statistics"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2011.19"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1988.10478671"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/65.1.141"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.2307\/3314660"},{"key":"ref18","first-page":"189","article-title":"Experimental Validation of a BIST Technique for CMOS Active Pixel Sensors","author":"lizarraga","year":"2009","journal-title":"27th IEEE VLSI Test Symposium VTS '09"},{"key":"ref4"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"494","DOI":"10.1145\/127601.127718","article-title":"Optimal ordering of analog integrated circuit tests to minimize test time","author":"huss","year":"1991","journal-title":"28th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843837"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2007.4449488"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-005-6361-9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/66.29679"},{"key":"ref2","article-title":"Ordering of Functional Tests Based on Parametric Defect Level Estimation","author":"akkouche","year":"2010","journal-title":"28th IEEE VLSI Test Symposium (VTS)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/43.285252"},{"key":"ref9","first-page":"111","article-title":"IC performance prediction for test cost reduction","author":"lee","year":"1999","journal-title":"IEEE international symposium on semiconductor manufacturing conference proceedings"}],"event":{"name":"2011 IEEE 6th International Design and Test Workshop (IDT)","start":{"date-parts":[[2011,12,11]]},"location":"Beirut, Lebanon","end":{"date-parts":[[2011,12,14]]}},"container-title":["2011 IEEE 6th International Design and Test Workshop (IDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6111737\/6123091\/06123095.pdf?arnumber=6123095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T12:36:56Z","timestamp":1497962216000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6123095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/idt.2011.6123095","relation":{},"subject":[],"published":{"date-parts":[[2011,12]]}}}