{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T20:26:45Z","timestamp":1725568005813},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/idt.2011.6123105","type":"proceedings-article","created":{"date-parts":[[2012,1,11]],"date-time":"2012-01-11T22:00:45Z","timestamp":1326319245000},"page":"74-77","source":"Crossref","is-referenced-by-count":2,"title":["Yield enhancement flow for analog and full custom designs reliability-rules automatic application"],"prefix":"10.1109","author":[{"given":"Ahmad","family":"Abdulghany","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rami","family":"Fathy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luigi","family":"Capodieci","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shobhit","family":"Malik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"909","author":"liu","year":"2010","journal-title":"Generation of Yield-Embedded Pareto-Front for Simultaneous Optimization of Yield and Performances"},{"key":"ref3","first-page":"31","author":"tiwary","year":"2006","journal-title":"Generation of yieldaware Pareto surfaces for hierarchical circuit design space exploration"},{"key":"ref5","first-page":"405","author":"berndlmaier","year":"2006","journal-title":"The Grand Pareto A Methodology for Identifying and Quantifying Yield Detractors in a Technology for Volume Semiconductor Manufacturing"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2003.1206215"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2011.2106850"}],"event":{"name":"2011 IEEE 6th International Design and Test Workshop (IDT)","start":{"date-parts":[[2011,12,11]]},"location":"Beirut, Lebanon","end":{"date-parts":[[2011,12,14]]}},"container-title":["2011 IEEE 6th International Design and Test Workshop (IDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6111737\/6123091\/06123105.pdf?arnumber=6123105","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T15:50:43Z","timestamp":1490111443000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6123105\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/idt.2011.6123105","relation":{},"subject":[],"published":{"date-parts":[[2011,12]]}}}