{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:07:40Z","timestamp":1730261260759,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,12]]},"DOI":"10.1109\/idt.2011.6123111","type":"proceedings-article","created":{"date-parts":[[2012,1,11]],"date-time":"2012-01-11T17:00:45Z","timestamp":1326301245000},"page":"104-109","source":"Crossref","is-referenced-by-count":2,"title":["4-D parity codes for soft error correction in aerospace applications"],"prefix":"10.1109","author":[{"given":"Muhammad","family":"Imran","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zaid","family":"Al-Ars","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georgi N.","family":"Gaydadjiev","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"1990","author":"abramovici","journal-title":"Digital Systems Testing and Testable Design","key":"ref4"},{"key":"ref3","article-title":"Design & Analysis of Fault Tolerant Digital Systems","author":"johnson","year":"1998","journal-title":"Electrical and Computer Engineering"},{"year":"2006","author":"imran","journal-title":"Using COTS Components in Space Applications","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/23.856502"},{"key":"ref5","article-title":"Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic","author":"premkishore","year":"2002","journal-title":"International Conference on Dependable Systems and Networks"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/ITCC.2004.1286763"},{"year":"0","author":"gravano","journal-title":"Introduction to Error Control Codes","key":"ref7"},{"key":"ref2","first-page":"1470","article-title":"The Design of Radiation-Hardened ICs for Space: A Compendium of Approaches","author":"kerns","year":"1998","journal-title":"Proceedings of the IEEE"},{"key":"ref9","volume":"44","author":"shirvani","year":"2000","journal-title":"Software-implemented EDAC Protection Against SEUs"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1098\/rsta.2002.1122"}],"event":{"name":"2011 IEEE 6th International Design and Test Workshop (IDT)","start":{"date-parts":[[2011,12,11]]},"location":"Beirut, Lebanon","end":{"date-parts":[[2011,12,14]]}},"container-title":["2011 IEEE 6th International Design and Test Workshop (IDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6111737\/6123091\/06123111.pdf?arnumber=6123111","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T15:36:59Z","timestamp":1490110619000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6123111\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,12]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/idt.2011.6123111","relation":{},"subject":[],"published":{"date-parts":[[2011,12]]}}}