{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:07:46Z","timestamp":1730261266874,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,12]]},"DOI":"10.1109\/idt.2013.6727090","type":"proceedings-article","created":{"date-parts":[[2014,1,31]],"date-time":"2014-01-31T23:35:43Z","timestamp":1391211343000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Opportunistic redundancy for improving reliability of embedded processors"],"prefix":"10.1109","author":[{"given":"Zheng","family":"Wang","sequence":"first","affiliation":[]},{"given":"Renlin","family":"Li","sequence":"additional","affiliation":[]},{"given":"Anupam","family":"Chattopadhyay","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1145\/1787275.1787342"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2002.1003565"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2008.31"},{"journal-title":"Error Control Coding Second Edition Upper Saddle River","year":"2004","author":"lin","key":"15"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/12.980007"},{"key":"13","article-title":"Diva:A dynamic approach to microprocessor verification","volume":"2","author":"austin","year":"2000","journal-title":"J Instruction-Level Parallelism"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228485"},{"key":"11","article-title":"Stratus ftserver fault tolerant platform","author":"somers","year":"2002","journal-title":"Intel Developer Forum"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/40.755464"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/WWC.2001.990739"},{"key":"20","first-page":"95","article-title":"LISA:A uniform adl for embedded processor modelling","author":"chattopadhyay","year":"2008","journal-title":"Implementation and Software Toolsuite Generation Chapter 5"},{"year":"0","key":"22"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523621"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/SSIRI.2009.38"},{"year":"0","key":"25"},{"year":"0","key":"26"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225959"},{"key":"10","article-title":"Data integrity in hp nonstop servers","author":"wood","year":"2006","journal-title":"2nd IEEE Workshop on Silicon Errors in Logic and System Effects"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"journal-title":"Error Control Coding Fundamentals and Applications","year":"1983","author":"lin","key":"7"},{"key":"6","article-title":"RAMP:A model for reliability aware microprocessor design","author":"srinivasan","year":"2003","journal-title":"IBM Research Report"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456959"},{"key":"4","first-page":"2","article-title":"Optical fault induction attacks","author":"skorobogatov","year":"2002","journal-title":"CHES 2523 of Lecture Notes in Computer Science"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781037"},{"key":"8","first-page":"43","article-title":"Probabilistic logics and synthesis of reliable organisms from unreliable components","author":"von neumann","year":"1956","journal-title":"Automata Studies"}],"event":{"name":"2013 Design and Test Symposium (IDT)","start":{"date-parts":[[2013,12,16]]},"location":"Marrakesh, Morocco","end":{"date-parts":[[2013,12,18]]}},"container-title":["2013 8th IEEE Design and Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6717187\/6727071\/06727090.pdf?arnumber=6727090","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T22:08:23Z","timestamp":1490220503000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6727090\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,12]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/idt.2013.6727090","relation":{},"subject":[],"published":{"date-parts":[[2013,12]]}}}