{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,13]],"date-time":"2026-01-13T03:36:26Z","timestamp":1768275386222,"version":"3.49.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,12]]},"DOI":"10.1109\/idt.2013.6727094","type":"proceedings-article","created":{"date-parts":[[2014,1,31]],"date-time":"2014-01-31T23:35:43Z","timestamp":1391211343000},"page":"1-6","source":"Crossref","is-referenced-by-count":11,"title":["BTI impact on SRAM sense amplifier"],"prefix":"10.1109","author":[{"given":"Innocent","family":"Agbo","sequence":"first","affiliation":[]},{"given":"Seyab","family":"Khan","sequence":"additional","affiliation":[]},{"given":"Said","family":"Hamdioui","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2009.03.016"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2136316"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.73"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2003.1269296"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2011.5783193"},{"key":"14","first-page":"152","article-title":"From mean values to distribution of bti lifetime of deeply scaled fets through atomistic understanding of the degradation","author":"luque","year":"2011","journal-title":"Symp on VLSI Tech"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000029458.57095.bb"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.75"},{"key":"21","doi-asserted-by":"crossref","DOI":"10.1109\/TC.2006.203","article-title":"Opens and delay faults in cmos circuits","author":"hamdioui","year":"2006","journal-title":"IEEE Transactions on Computers"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2000.893615"},{"key":"22","article-title":"Impact of partial resistive defects and bias temperature defects and bias temperature instability on sram decoder reliability","author":"khan","year":"2012","journal-title":"Pro of 7th IEEE International Design and Test Symposium"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187515"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090694"},{"key":"25","author":"kukner","year":"2011","journal-title":"Generic and Orthogonal March Element based Memory BIST Engine"},{"key":"26","author":"cosemans","year":"2009","journal-title":"Variability-aware design of low power SRAM memories"},{"key":"27","year":"0"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.040"},{"key":"2","article-title":"Micro architecture and design challenges for giga scale integration","author":"borkar","year":"2004","journal-title":"Proc of international symposium of micro-architectures"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-36046-6_4"},{"key":"1","year":"0"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2006.1705198"},{"key":"6","first-page":"381","article-title":"Disorder-controlled-kinetics model nbti and its experimental verification","author":"kackzar","year":"2005","journal-title":"Proc of Intl Physics Reliability Symp (IPRS)"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.852523"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231060"},{"key":"8","first-page":"73","article-title":"The Impact of bTI for direct tunneling ultra thin gate oxide of mOSFET scaling","author":"kizmuka","year":"1999","journal-title":"VLSI Technology Digest of Technical Papers"}],"event":{"name":"2013 Design and Test Symposium (IDT)","location":"Marrakesh, Morocco","start":{"date-parts":[[2013,12,16]]},"end":{"date-parts":[[2013,12,18]]}},"container-title":["2013 8th IEEE Design and Test Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6717187\/6727071\/06727094.pdf?arnumber=6727094","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T07:05:28Z","timestamp":1498115128000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6727094\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,12]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/idt.2013.6727094","relation":{},"subject":[],"published":{"date-parts":[[2013,12]]}}}