{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T07:44:30Z","timestamp":1725435870624},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/idt.2015.7396722","type":"proceedings-article","created":{"date-parts":[[2016,2,4]],"date-time":"2016-02-04T16:56:52Z","timestamp":1454605012000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Keynote 2: \"Computing for big-data: Beyond CMOS and beyond Von-Neumann\""],"prefix":"10.1109","author":[{"given":"Said","family":"Hamdioui","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2015 10th International Design & Test Symposium (IDT)","start":{"date-parts":[[2015,12,14]]},"location":"Dead Sea, Amman, Jordan","end":{"date-parts":[[2015,12,16]]}},"container-title":["2015 10th International Design & Test Symposium (IDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7383418\/7396715\/07396722.pdf?arnumber=7396722","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T13:07:20Z","timestamp":1489756040000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7396722\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/idt.2015.7396722","relation":{},"subject":[],"published":{"date-parts":[[2015,12]]}}}