{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T20:14:51Z","timestamp":1773778491763,"version":"3.50.1"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,12,1]],"date-time":"2016-12-01T00:00:00Z","timestamp":1480550400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,12]]},"DOI":"10.1109\/idt.2016.7843055","type":"proceedings-article","created":{"date-parts":[[2017,2,7]],"date-time":"2017-02-07T15:56:19Z","timestamp":1486482979000},"page":"278-283","source":"Crossref","is-referenced-by-count":4,"title":["Accelerating the debugging of FV traces using K-means clustering techniques"],"prefix":"10.1109","author":[{"given":"Eman","family":"El Mandouh","sequence":"first","affiliation":[{"name":"Mentor Graphics Corporation, Egypt"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amr G.","family":"Wassal","sequence":"additional","affiliation":[{"name":"Computer Engineering Department, Cairo University, Egypt"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457129"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2010.5419813"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2012.6271758"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511809071"},{"key":"ref14","author":"tan","year":"2005","journal-title":"Introduction to Data Mining"},{"key":"ref15","author":"fox","year":"0","journal-title":"MachIne Learning Clustering and Retrieval"},{"key":"ref16","first-page":"1027","article-title":"k-means++: the advantages of careful seeding","author":"arthur","year":"2007","journal-title":"Proc 17th ACM-SIAM Symposium on Discrete Algorithm"},{"key":"ref17","year":"0","journal-title":"Opencres benchmarks"},{"key":"ref18","author":"allan","year":"0","journal-title":"Coverage Cookbook Mentor Graphics"},{"key":"ref4","first-page":"46","article-title":"Certus Silicon Debug: Don't Prototype Without It","volume":"12","author":"amos","year":"2016","journal-title":"Verification Horizons"},{"key":"ref3","article-title":"Aldec inc","year":"0","journal-title":"Acive-HDL Post Simulation Debugging"},{"key":"ref6","article-title":"Efficient Selection of Trace and Scan Signals for Post-Silicon Debug","author":"basu","year":"2015","journal-title":"IEEE Transaction on Very Large Scale Integration (VLSI) Systems"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2011.14"},{"key":"ref8","first-page":"1","article-title":"Post-Silicon Debug Using Formal Verification Waypoints","author":"richard ho","year":"2009","journal-title":"Proceedings of Design and Verification Conference DVCon"},{"key":"ref7","first-page":"985","article-title":"Enabling efficient post-silicon debug by clustering of hardware-assertions","author":"mh","year":"2010","journal-title":"Proc of Design Automat Test Eur (DATE)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.67"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391536"},{"key":"ref9","author":"dehbashi","year":"0","journal-title":"Automated Post-Silicon Debugging of Design Bugs"}],"event":{"name":"2016 11th International Design & Test Symposium (IDT)","location":"Hammamet, Tunisia","start":{"date-parts":[[2016,12,18]]},"end":{"date-parts":[[2016,12,20]]}},"container-title":["2016 11th International Design & Test Symposium (IDT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7833312\/7842992\/07843055.pdf?arnumber=7843055","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,4]],"date-time":"2025-09-04T21:59:01Z","timestamp":1757023141000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7843055\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,12]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/idt.2016.7843055","relation":{},"subject":[],"published":{"date-parts":[[2016,12]]}}}