{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T15:00:12Z","timestamp":1764687612314},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/iecon.2012.6389595","type":"proceedings-article","created":{"date-parts":[[2013,1,2]],"date-time":"2013-01-02T23:15:46Z","timestamp":1357168546000},"source":"Crossref","is-referenced-by-count":43,"title":["Power hardware-in-the-loop testing of a 500 kW photovoltaic array inverter"],"prefix":"10.1109","author":[{"given":"James","family":"Langston","sequence":"first","affiliation":[]},{"given":"Karl","family":"Schoder","sequence":"additional","affiliation":[]},{"given":"Mischa","family":"Steurer","sequence":"additional","affiliation":[]},{"given":"Omar","family":"Faruque","sequence":"additional","affiliation":[]},{"given":"John","family":"Hauer","sequence":"additional","affiliation":[]},{"given":"Ferenc","family":"Bogdan","sequence":"additional","affiliation":[]},{"given":"Richard","family":"Bravo","sequence":"additional","affiliation":[]},{"given":"Barry","family":"Mather","sequence":"additional","affiliation":[]},{"given":"Farid","family":"Katiraei","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ESTS.2005.1524676"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/WESCAN.1995.494045"},{"key":"11","article-title":"Hardware-in-the-loop testing of a high speed generator excitation controller","author":"schoder","year":"2010","journal-title":"Proc 2010 ASNE Electric Machines Technology Symposium"},{"key":"12","article-title":"Megawatt scale hardware-in-the-loop testing of a high speed generator","author":"langston","year":"2012","journal-title":"Proc ASNE Day 2012"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2027246"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2011.6119915"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.926240"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2009.2018048"},{"key":"7","author":"mathur","year":"0"},{"key":"6","author":"bravo","year":"2012","journal-title":"SCE 3-Phase Solar PV Inverter Test Procedure"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2011.5744862"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IPEC.2010.5543898"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2010.2101572"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2036639"}],"event":{"name":"IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics","location":"Montreal, QC, Canada","start":{"date-parts":[[2012,10,25]]},"end":{"date-parts":[[2012,10,28]]}},"container-title":["IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6373889\/6388505\/06389595.pdf?arnumber=6389595","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T22:12:14Z","timestamp":1490220734000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6389595\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iecon.2012.6389595","relation":{},"subject":[],"published":{"date-parts":[[2012,10]]}}}