{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T06:50:17Z","timestamp":1725778217760},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1109\/iecon.2013.6700008","type":"proceedings-article","created":{"date-parts":[[2014,1,6]],"date-time":"2014-01-06T12:14:59Z","timestamp":1389010499000},"page":"5364-5367","source":"Crossref","is-referenced-by-count":4,"title":["Commissioning of MW-scale Power Hardware-in-the-Loop interfaces for experiments with AC\/DC Converters"],"prefix":"10.1109","author":[{"given":"Karl","family":"Schoder","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"James","family":"Langston","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael","family":"Steurer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/TIA.2008.926240"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1111\/j.1559-3584.2009.00233.x"},{"key":"10","article-title":"Role of hardware-in-The-loop simulation testing in transitioning new technology to the ship","author":"langston","year":"2013","journal-title":"Proceedings of the IEEE Electric Ship Technologies Symposium"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/PES.2006.1709482"},{"doi-asserted-by":"publisher","key":"7","DOI":"10.1109\/ICDS.1995.492357"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/IECON.2012.6389595"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/IECON.2011.6119916"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/IECON.2011.6119915"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/PES.2009.5275631"},{"key":"8","article-title":"Megawatt scale hardware-in-The-loop testing of a high speed generator","author":"langston","year":"2012","journal-title":"Proceeding of ASNE Day"}],"event":{"name":"IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2013,11,10]]},"location":"Vienna, Austria","end":{"date-parts":[[2013,11,13]]}},"container-title":["IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6683943\/6699103\/06700008.pdf?arnumber=6700008","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T20:04:34Z","timestamp":1490213074000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6700008\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,11]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iecon.2013.6700008","relation":{},"subject":[],"published":{"date-parts":[[2013,11]]}}}