{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T06:03:53Z","timestamp":1725429833563},"reference-count":34,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,11]]},"DOI":"10.1109\/iecon.2013.6700251","type":"proceedings-article","created":{"date-parts":[[2014,1,6]],"date-time":"2014-01-06T17:14:59Z","timestamp":1389028499000},"page":"6758-6763","source":"Crossref","is-referenced-by-count":1,"title":["Mitigation of Single Event Upsets in the control logic of a charge equalizer for Li-ion batteries"],"prefix":"10.1109","author":[{"given":"Federico","family":"Baronti","sequence":"first","affiliation":[]},{"given":"Cinzia","family":"Bernardeschi","sequence":"additional","affiliation":[]},{"given":"Luca","family":"Cassano","sequence":"additional","affiliation":[]},{"given":"Andrea","family":"Domenici","sequence":"additional","affiliation":[]},{"given":"Roberto","family":"Roncella","sequence":"additional","affiliation":[]},{"given":"Roberto","family":"Saletti","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ECBS.2010.29"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2012.6389243"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2010.5637270"},{"key":"33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.04.055"},{"year":"0","key":"15"},{"key":"34","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2012.6378210"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2223479"},{"year":"0","key":"13"},{"year":"0","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2047407"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2010.08.005"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2002.1045531"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2010.5461655"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2043855"},{"key":"23","article-title":"Ft-unshades: A new system for seu injection, analysis and diagnostics over post synthesis netlist","author":"aguirre","year":"2005","journal-title":"Proceedings of the 8th Military and Aerospace Programmable Logic Devices International Conference (MAPLD'05"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"25","article-title":"Consequences and categories of sram fpga configuration seus","author":"graham","year":"2003","journal-title":"Proceedings of the 6th Military and Aerospace Applications of Programmable Logic Devices (MAPLD'03"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1142\/S0129156404002351"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"key":"28","doi-asserted-by":"crossref","first-page":"372","DOI":"10.1109\/DFTVS.2002.1173534","article-title":"A new functional fault model for fpga application-oriented testing","author":"rebaudengo","year":"2002","journal-title":"Proceedings of the 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2002"},{"journal-title":"Fault-Tolerance Techniques for SRAM-Based FPGAs (Frontiers in Electronic Testing)","year":"2006","author":"kastensmidt","key":"29"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190170"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2076414"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(99)00329-8"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2011.2116752"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1109\/VPPC.2011.6043074"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2004.02.032"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2222650"},{"key":"32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2185248"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176637"},{"key":"31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2050750"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2013.2250351"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/VPPC.2008.4677669"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2012.6237284"}],"event":{"name":"IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2013,11,10]]},"location":"Vienna, Austria","end":{"date-parts":[[2013,11,13]]}},"container-title":["IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6683943\/6699103\/06700251.pdf?arnumber=6700251","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T05:24:58Z","timestamp":1498109098000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6700251\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,11]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/iecon.2013.6700251","relation":{},"subject":[],"published":{"date-parts":[[2013,11]]}}}