{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,5]],"date-time":"2025-05-05T15:45:59Z","timestamp":1746459959138,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,11]]},"DOI":"10.1109\/iecon.2015.7392522","type":"proceedings-article","created":{"date-parts":[[2016,3,8]],"date-time":"2016-03-08T22:52:31Z","timestamp":1457477551000},"page":"002777-002782","source":"Crossref","is-referenced-by-count":13,"title":["Reliability assessment of fault tolerant permanent magnet AC drives"],"prefix":"10.1109","author":[{"given":"G.","family":"El Murr","sequence":"first","affiliation":[]},{"given":"A.","family":"Griffo","sequence":"additional","affiliation":[]},{"given":"J.","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Z.Q.","family":"Zhu","sequence":"additional","affiliation":[]},{"given":"B.","family":"Mecrow","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2161639"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2404306"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2003.1290728"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2009.5316140"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PSEC.2002.1022381"},{"article-title":"Markov Modeling for Reliability Analysis","year":"1998","author":"pukite","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/5.18626"},{"key":"ref17","first-page":"11","article-title":"reliability analysis of fault tolerant drive topologies","author":"argile","year":"2008","journal-title":"2008 4th IET Conference on Power Electronics Machines and Drives CPEMD"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2168543"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2009.5316091"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/ip-epa:19960796"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.823323"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"286","DOI":"10.1049\/cp:19991036","article-title":"predicting the design life of high integrity rotating electrical machines","author":"tavner","year":"1999","journal-title":"Proceedings of 9th International Conference on Electrical Machines and Drives"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/28.511646"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2049623"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2007.896978"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VPPC.2010.5729031"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/07IAS.2007.91"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PCICON.1994.347637"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.826514"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.830074"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2009.4839533"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/28.464536"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.1986.4765668"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"3523","DOI":"10.1109\/TIE.2011.2165453","article-title":"Overview of Electric Motor Technologies Used for More Electric Aircraft (MEA)","volume":"59","author":"cao","year":"2012","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2006.1711985"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IAS.2007.205"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2006.295929"}],"event":{"name":"IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2015,11,9]]},"location":"Yokohama","end":{"date-parts":[[2015,11,12]]}},"container-title":["IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7378180\/7392066\/07392522.pdf?arnumber=7392522","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,7,10]],"date-time":"2020-07-10T20:59:32Z","timestamp":1594414772000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7392522\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/iecon.2015.7392522","relation":{},"subject":[],"published":{"date-parts":[[2015,11]]}}}