{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,12]],"date-time":"2025-09-12T18:03:10Z","timestamp":1757700190025},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/iecon.2016.7793316","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T16:47:13Z","timestamp":1483634833000},"page":"371-376","source":"Crossref","is-referenced-by-count":9,"title":["UAV remote laser scanner improvement by continuous scanning using DC motors"],"prefix":"10.1109","author":[{"given":"Lars","family":"Lindner","sequence":"first","affiliation":[]},{"given":"Fabian N.","family":"Muerrieta-Rico","sequence":"additional","affiliation":[]},{"given":"Paolo","family":"Mercorelli","sequence":"additional","affiliation":[]},{"given":"Alexander","family":"Gurko","sequence":"additional","affiliation":[]},{"given":"Oleg","family":"Sergiyenko","sequence":"additional","affiliation":[]},{"given":"Moises","family":"Rivas-Lopez","sequence":"additional","affiliation":[]},{"given":"Benjamin","family":"Valdez-Salas","sequence":"additional","affiliation":[]},{"given":"Julio C.","family":"Rodriguez-Quinonez","sequence":"additional","affiliation":[]},{"given":"Daniel","family":"Hernandez-Balbuena","sequence":"additional","affiliation":[]},{"given":"Wendy","family":"Flores-Fuentes","sequence":"additional","affiliation":[]},{"given":"Vera","family":"Tyrsa","sequence":"additional","affiliation":[]},{"family":"Misael Medina Barrera","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2010.5637874"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2014.6864910"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2013.6699816"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2015.7281602"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2013.11.008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2013.08.005"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2008.03.009"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2015.7281598"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2016.02.019"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.15517\/am.v22i2.11799"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3103\/S8756699011050037"},{"journal-title":"Fundamental Principles of Engineering Nanometrology","year":"2014","author":"leach","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1108\/IR-01-2016-0048"}],"event":{"name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2016,10,23]]},"location":"Florence","end":{"date-parts":[[2016,10,26]]}},"container-title":["IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7782522\/7792929\/07793316.pdf?arnumber=7793316","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,6]],"date-time":"2020-03-06T13:20:19Z","timestamp":1583500819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7793316\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iecon.2016.7793316","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}