{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:24:48Z","timestamp":1730262288749,"version":"3.28.0"},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/iecon.2016.7793952","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T16:47:13Z","timestamp":1483634833000},"page":"7179-7184","source":"Crossref","is-referenced-by-count":0,"title":["Key data set selection algorithm based on PLS regression in industrial process"],"prefix":"10.1109","author":[{"family":"Mingyang Yang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Xuebo Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Chengming Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Hongpeng Zhou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2008.12.002"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2214394"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399396"},{"key":"ref12","first-page":"2006","article-title":"Asymmetric learning based on kernel partial least squares for software defect prediction","volume":"95","author":"guangchun","year":"2012","journal-title":"IEICE Trans Inf Syst"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1366\/000370210792434350"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(01)00154-X"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(01)00152-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2005.00532.x"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.csda.2007.01.007"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/cem.1360"},{"key":"ref19","first-page":"1205","article-title":"Efficient feature selection via analysis of relevance and redundancy","volume":"5","author":"yu","year":"2004","journal-title":"Journal Machine Learning Research"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2009.00723.x"},{"key":"ref4","article-title":"Fault detection for nonlinear process with deterministic disturbances: A Just-in-time learning based data driven method","author":"yin","year":"2016","journal-title":"IEEE Transactions on Cybernetics"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(01)00158-7"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2207655"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2213560"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2004.12.011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2014.2341934"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2185011"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2016.2564921"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2185330"},{"key":"ref9","article-title":"An adaptive NN-based approach for fault-tolerant control of nonlinear time-varying delay systems with unmodeled dynamics","author":"yin","year":"2016","journal-title":"IEEE Transactions on Neural Networks and Learning Systems"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2345331"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1021\/ac960321m"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2007.10.001"},{"key":"ref21","first-page":"1371","article-title":"Overfitting in making comparisons between variable selection methods","volume":"8","author":"reunanen","year":"2003","journal-title":"J Mach Learn Res"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00113-1"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2012.07.010"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00113-1"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1002\/cem.1180060605"}],"event":{"name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2016,10,23]]},"location":"Florence","end":{"date-parts":[[2016,10,26]]}},"container-title":["IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7782522\/7792929\/07793952.pdf?arnumber=7793952","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,6]],"date-time":"2020-03-06T13:20:32Z","timestamp":1583500832000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/7793952\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/iecon.2016.7793952","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}