{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T20:25:23Z","timestamp":1729628723723,"version":"3.28.0"},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/iecon.2016.7793954","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T16:47:13Z","timestamp":1483634833000},"page":"7143-7148","source":"Crossref","is-referenced-by-count":0,"title":["A novel SVM-RFE based biomedical data processing approach: Basic and beyond"],"prefix":"10.1109","author":[{"family":"Zuyu Yin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Zhongyang Fei","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Chengming Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ao Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1002\/cem.800"},{"key":"ref30","doi-asserted-by":"crossref","first-page":"271","DOI":"10.1023\/A:1017181826899","article-title":"Glossary of terms","volume":"30","author":"kohavi","year":"1998","journal-title":"Machine Learning"},{"key":"ref10","volume":"2","author":"vapnik","year":"1998","journal-title":"Statistical Learning Theory"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/72.788640"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2188804"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2389625"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2231870"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2015.06.027"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2013.11.003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2009.05.045"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(02)00044-4"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.eij.2010.10.005"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2014.05.035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00058-7"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2004.834967"},{"key":"ref3","first-page":"1","article-title":"Performance monitoring for vehicle suspension system via fuzzy positivistic c-means clustering based on accelerometer measurements","author":"yin","year":"2014","journal-title":"IEEE\/ASME Transactions on Mechatronics"},{"key":"ref6","first-page":"1","article-title":"Application of mel cepstral processing and support vector machines for diagnosing vocal disorders from voice recordings","author":"grygiel","year":"2011","journal-title":"Signal Processing Algorithms Architectures Arrangements and Applications Conference Proceedings (SPA) 2011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10978"},{"key":"ref29","first-page":"1701","volume":"2014","author":"yin","year":"2014","journal-title":"Study on support vector machine-based fault detection in tennessee eastman process"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2014.6889697"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.2008.4649387"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2007.02.007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.1997.641482"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/cjce.5450690105"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1287\/opre.43.4.570"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2013.08.044"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s13534-014-0148-9"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2010.09.018"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2012.10.016"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2319216"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2224354"}],"event":{"name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2016,10,23]]},"location":"Florence, Italy","end":{"date-parts":[[2016,10,26]]}},"container-title":["IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7782522\/7792929\/07793954.pdf?arnumber=7793954","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,25]],"date-time":"2017-06-25T07:20:28Z","timestamp":1498375228000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7793954\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/iecon.2016.7793954","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}