{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T08:54:06Z","timestamp":1725699246648},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/iecon.2016.7794096","type":"proceedings-article","created":{"date-parts":[[2017,1,5]],"date-time":"2017-01-05T16:47:13Z","timestamp":1483634833000},"page":"6782-6787","source":"Crossref","is-referenced-by-count":1,"title":["Event-triggered fault detection for discrete-time networked control systems"],"prefix":"10.1109","author":[{"given":"Yu-Long","family":"Wang","sequence":"first","affiliation":[]},{"given":"Peng","family":"Shi","sequence":"additional","affiliation":[]},{"given":"Cheng-Chew","family":"Lim","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2103533"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2015.08.049"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2351952"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.10.092"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2012.2206694"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2012.2211411"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2013.0253"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2015.2507177"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.fss.2014.09.013"},{"journal-title":"Control System Design An Introduction to State-Space Methods","year":"1986","author":"friedland","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2013.2286911"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2014.2352291"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2363312"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2526648"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2014.2377175"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/rnc.1546"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2013.2274711"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2013.2281993"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2011.2163797"}],"event":{"name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2016,10,23]]},"location":"Florence, Italy","end":{"date-parts":[[2016,10,26]]}},"container-title":["IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7782522\/7792929\/07794096.pdf?arnumber=7794096","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,11]],"date-time":"2017-01-11T00:31:40Z","timestamp":1484094700000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7794096\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iecon.2016.7794096","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}