{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:25:21Z","timestamp":1730262321589,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/iecon.2017.8216043","type":"proceedings-article","created":{"date-parts":[[2017,12,21]],"date-time":"2017-12-21T17:02:40Z","timestamp":1513875760000},"page":"233-238","source":"Crossref","is-referenced-by-count":2,"title":["Estimation of single-event voltage sags using a novel classification method"],"prefix":"10.1109","author":[{"given":"Wenxiong","family":"Mo","sequence":"first","affiliation":[]},{"given":"Zhong","family":"Xu","sequence":"additional","affiliation":[]},{"given":"Zhiyuan","family":"Ma","sequence":"additional","affiliation":[]},{"given":"Chenyi","family":"Li","sequence":"additional","affiliation":[]},{"given":"Wenqing","family":"Lu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2001.964598"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2007.385457"},{"journal-title":"Uncertainty description and assessment of indicators for voltage sags evaluation[D]","year":"2016","author":"ai","key":"ref12"},{"key":"ref13","first-page":"48","article-title":"Uncertainty description and assessment of incompatibility & influence index for voltage sags[J]","volume":"32","author":"jia","year":"2017","journal-title":"Transactions of China Electrotechnical Society"},{"journal-title":"Specification for Semiconductor Processing Equipment Voltage Sag Immunity","year":"2006","key":"ref14"},{"journal-title":"Voltage Dip Immunity of Equipment and Installations[R]","year":"2010","key":"ref15"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2011.631082"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7796(03)00072-5"},{"key":"ref6","article-title":"Power quality indices based on voltage sag energy values[C]","author":"thallam","year":"2001","journal-title":"Proc Power Quality Conf Expo"},{"journal-title":"IEEE Guide for Voltage Sag Indices","year":"0","key":"ref5"},{"key":"ref8","first-page":"1","article-title":"A dsPic-Based Measurement System for the Evaluation of Voltage Sag Severity Trough New Power Quality Indexes[C]","author":"capual","year":"2005","journal-title":"IEEE Virtual Environments Giardini Naxos Italy International Conference on Human-Computer Interfaces and Measurement Systems"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/QSEPDS.2003.1259321"},{"key":"ref2","article-title":"Pan European LPQI power quality survey[R]","author":"targosz","year":"2007","journal-title":"Cired 19th International Conference on Electricity Distribution"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2007.893438"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2010.5625429"}],"event":{"name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2017,10,29]]},"location":"Beijing","end":{"date-parts":[[2017,11,1]]}},"container-title":["IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8168197\/8216002\/08216043.pdf?arnumber=8216043","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,1,23]],"date-time":"2018-01-23T15:38:18Z","timestamp":1516721898000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8216043\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iecon.2017.8216043","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}