{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T03:52:33Z","timestamp":1725767553851},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/iecon.2017.8216065","type":"proceedings-article","created":{"date-parts":[[2017,12,21]],"date-time":"2017-12-21T22:02:40Z","timestamp":1513893760000},"page":"363-368","source":"Crossref","is-referenced-by-count":1,"title":["On the performance of space vector EPLL-based grid synchronization technique during power quality disturbances"],"prefix":"10.1109","author":[{"given":"Johnny","family":"Chhor","sequence":"first","affiliation":[]},{"given":"Panagiotis","family":"Manolioudakis","sequence":"additional","affiliation":[]},{"given":"Florian","family":"Bendrat","sequence":"additional","affiliation":[]},{"given":"Constantinos","family":"Sourkounis","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MED.2017.7984214"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/9780470667057"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2005.1568946"},{"journal-title":"Closing the Gap Between ASIC and CustomTools and Techniques for High-Performance ASIC Design","year":"2002","author":"chinnery","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2011.2124466"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.841038"},{"year":"2011","key":"ref16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2013.6699452"},{"journal-title":"Understanding Power Quality Problems Voltage Sags and Interruptions","year":"2000","author":"bollen","key":"ref18"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2206350"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2653861"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2015.7104656"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2011.5975946"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2010.5636574"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2015.7281609"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2565642"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIA.2007.4283506"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCET.2009.74"}],"event":{"name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2017,10,29]]},"location":"Beijing","end":{"date-parts":[[2017,11,1]]}},"container-title":["IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8168197\/8216002\/08216065.pdf?arnumber=8216065","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,25]],"date-time":"2022-01-25T22:36:33Z","timestamp":1643150193000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8216065\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iecon.2017.8216065","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}