{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:25:58Z","timestamp":1730262358039,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/iecon.2017.8216221","type":"proceedings-article","created":{"date-parts":[[2017,12,21]],"date-time":"2017-12-21T17:02:40Z","timestamp":1513875760000},"page":"1299-1306","source":"Crossref","is-referenced-by-count":5,"title":["Modelling of high frequency effects of laminated iron-core power inductors and reduction of parasitic capacitance"],"prefix":"10.1109","author":[{"given":"Shushu","family":"Zhu","sequence":"first","affiliation":[]},{"given":"Xibo","family":"Yuan","sequence":"additional","affiliation":[]},{"given":"Phil","family":"Mellor","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TEMC.2011.2116795"},{"year":"2012","journal-title":"Power Electronics and Motion Control Conference","article-title":"The role of the Parasitic Capacitance of the Inductor in Boost Converters with Normally-on SiC JFETs","key":"ref11"},{"key":"ref12","first-page":"296","article-title":"Integration of EMI Filter for Distributed Power System (DPS) Front-end Converter","author":"chen","year":"2003","journal-title":"IEEE Power Electronics Specialists Conference Records"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TPEL.2005.861103"},{"key":"ref14","first-page":"1839","article-title":"Model of Laminated Iron-core Inductors for High Frequencies","volume":"4","author":"grandi","year":"2001","journal-title":"IEEE Transactions on Magnetics"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1109\/TPS.2011.2163167"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ECCE.2015.7310523"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TPEL.2015.2510425"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/MWSCAS.1997.666108"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1049\/ip-cds:20045217"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/EEIC.1993.631185"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ICELMACH.2014.6960500"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/ITEC-AP.2016.7512950"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/JESTPE.2016.2562112"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/APEC.2000.822574"}],"event":{"name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2017,10,29]]},"location":"Beijing","end":{"date-parts":[[2017,11,1]]}},"container-title":["IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8168197\/8216002\/08216221.pdf?arnumber=8216221","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,1,26]],"date-time":"2018-01-26T04:59:19Z","timestamp":1516942759000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8216221\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iecon.2017.8216221","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}