{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:17:06Z","timestamp":1730261826252,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/iecon.2017.8217123","type":"proceedings-article","created":{"date-parts":[[2017,12,21]],"date-time":"2017-12-21T22:02:40Z","timestamp":1513893760000},"page":"6445-6451","source":"Crossref","is-referenced-by-count":0,"title":["Benchmarking of real-time simulation model of modular multilevel converter"],"prefix":"10.1109","author":[{"given":"Luc-Andre","family":"Gregoire","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weihua","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad","family":"Sleiman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kamal","family":"Al-Haddad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2060737"},{"journal-title":"Validation of the continuous model of the modular multilevel converter with blocking\/deblocking capability","year":"2012","author":"ahmed","key":"ref11"},{"key":"ref12","article-title":"A novel modular multilevel converter modelling technique based on semianalytical models for HVDC application","volume":"12","author":"zama","year":"2016","journal-title":"Journal of Electrical Systems"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2541461"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-4754(03)00072-7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2631570"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2016.2565512"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2631570"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2321049"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2017.7915586"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICELMACH.2014.6960268"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2290313"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2015.7125468"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7855091"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICPE.2011.5944451"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2003.1304403"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PEDG.2016.7527082"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2327641"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2017.7930952"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2357674"}],"event":{"name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2017,10,29]]},"location":"Beijing","end":{"date-parts":[[2017,11,1]]}},"container-title":["IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8168197\/8216002\/08217123.pdf?arnumber=8217123","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T03:22:56Z","timestamp":1643167376000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8217123\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iecon.2017.8217123","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}