{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,4]],"date-time":"2025-11-04T16:03:55Z","timestamp":1762272235548},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/iecon.2017.8217426","type":"proceedings-article","created":{"date-parts":[[2017,12,21]],"date-time":"2017-12-21T22:02:40Z","timestamp":1513893760000},"page":"8126-8131","source":"Crossref","is-referenced-by-count":12,"title":["New attack vectors for building automation and IoT"],"prefix":"10.1109","author":[{"given":"Dominik","family":"Meyer","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jan","family":"Haase","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marcel","family":"Eckert","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bernd","family":"Klauer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TIE.2009.2036033"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/RAICS.2015.7488451"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1145\/310889.310900"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/WF-IoT.2015.7389144"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/EFTA.2007.4416910"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/SSIC.2015.7245682"},{"key":"ref7","first-page":"119","article-title":"A risk assessment framework and software toolkit for cloud service ecosystems","author":"djemame","year":"2011","journal-title":"Cloud Computing"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/ICCIC.2015.7435678"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1007\/978-3-319-62072-5_8"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/INDIN.2016.7819280"}],"event":{"name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2017,10,29]]},"location":"Beijing","end":{"date-parts":[[2017,11,1]]}},"container-title":["IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8168197\/8216002\/08217426.pdf?arnumber=8217426","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,1,23]],"date-time":"2018-01-23T20:37:37Z","timestamp":1516739857000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8217426\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iecon.2017.8217426","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}