{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,5]],"date-time":"2026-05-05T15:32:57Z","timestamp":1777995177118,"version":"3.51.4"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/iecon.2018.8591186","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T17:30:15Z","timestamp":1547832615000},"page":"4712-4719","source":"Crossref","is-referenced-by-count":7,"title":["Applicability of Context-Aware Health Monitoring to Hydraulic Circuits"],"prefix":"10.1109","author":[{"given":"M.","family":"Gotzinger","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Willegger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"TaheriNejad","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Jantsch","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Sauter","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Glatzl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Lilieberg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.buildenv.2013.11.021"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1115\/ES2011-54885"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.buildenv.2010.05.031"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.enconman.2005.11.010"},{"key":"ref14","article-title":"Intelligent model based fault detection and diagnosis for hvac system using statistical machine learning mehtods","author":"guo","year":"2013","journal-title":"ASHRAE 2013 Conference January Dallas"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.enbuild.2013.05.037"},{"key":"ref16","article-title":"Fault detection in lighting systems - first phase results","author":"sharifi","year":"2011","journal-title":"Philips Research North-America Technical Note"},{"key":"ref17","first-page":"406","article-title":"A statistical pattern analysis framework for rooftop unit diagnostics","author":"najafi","year":"2012","journal-title":"HVAC&R Research"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/10789669.2001.10391431"},{"key":"ref4","article-title":"Energiestatistik: Energiebilanzen &#x00F6;sterreich 1970 bis 2016","author":"austria","year":"2017","journal-title":"Website"},{"key":"ref3","article-title":"Energy efficiency directive","author":"commission","year":"2012","journal-title":"Website"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2017.7946814"},{"key":"ref5","author":"massieh","year":"2010","journal-title":"Fault detection and diagnosis in building HVAC systems"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1080\/10789669.2005.10391123"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"3","DOI":"10.1080\/23744731.2017.1318008","article-title":"A review of fault detection and diagnostics methods for building systems","volume":"24","author":"woohyun","year":"2018","journal-title":"Sci Technol Built Environ"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.enbuild.2016.06.089"},{"key":"ref1","article-title":"Electricity information: Overview","year":"2017","journal-title":"International Energy Agency Note"},{"key":"ref9","author":"dexter","year":"2001","journal-title":"Demonstrating Automated Fault Detection and Diagnosis Methods in Real Buildings"}],"event":{"name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","location":"Washington, DC","start":{"date-parts":[[2018,10,21]]},"end":{"date-parts":[[2018,10,23]]}},"container-title":["IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8560606\/8591058\/08591186.pdf?arnumber=8591186","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T02:09:08Z","timestamp":1598234948000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8591186\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iecon.2018.8591186","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}