{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:21:44Z","timestamp":1730262104786,"version":"3.28.0"},"reference-count":33,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/iecon.2018.8591263","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T17:30:15Z","timestamp":1547832615000},"page":"5353-5358","source":"Crossref","is-referenced-by-count":2,"title":["An Adaptive Data-Driven Fault Detection Method for Monitoring Dynamic Process"],"prefix":"10.1109","author":[{"given":"Zhiwen","family":"Chen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tao","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunhua","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fanbiao","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhangming","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2007.07.006"},{"key":"ref32","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-0347-9","author":"chiang","year":"2001","journal-title":"Fault Detection and Diagnosis in Industrial Systems"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898719512"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2015.04.016"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(94)00079-X"},{"key":"ref11","first-page":"398","article-title":"Quality-related fault detection approach based on orthogonal signal correction and modified pls","volume":"11","author":"wang","year":"2015","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2015.02.006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2016.02.006"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733501"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/0169-7439(95)00076-3"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690430916"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2015.10.006"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"1446","DOI":"10.1016\/j.isatra.2013.12.018","article-title":"Adaptive PCA based fault diagnosis scheme in imperial smelting process","volume":"53","author":"hu","year":"2014","journal-title":"ISA Transactions"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(97)00262-7"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2005.843856"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2208638"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2016.2636337"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2015.06.007"},{"key":"ref29","article-title":"A least squares interpretation of subspace methods for system identification","author":"ljung","year":"1996","journal-title":"Proceedings CDC Conference"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/0959-1524(96)00009-1"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2017.09.021"},{"key":"ref2","article-title":"Statistical process monitoring as a big data analytics tool for smart manufacturing","author":"he","year":"2017","journal-title":"Journal of Process Control"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/aic.10035"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-6410-4","author":"ding","year":"2014","journal-title":"Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems"},{"key":"ref20","first-page":"1","article-title":"Efficient recursive canonical variate analysis approach for monitoring time-varying processes","volume":"31","author":"shang","year":"2016","journal-title":"Journal of Chemometrics"},{"key":"ref22","first-page":"1239","article-title":"Data-driven quality monitoring and fault detection for multimode nonlinear processes","author":"hagahni","year":"2012","journal-title":"51st IEEE Conf Decision and Control"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1021\/ie0497893"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2799600"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11515"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2009.07.005"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2013.08.011"}],"event":{"name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2018,10,21]]},"location":"D.C., DC, USA","end":{"date-parts":[[2018,10,23]]}},"container-title":["IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8560606\/8591058\/08591263.pdf?arnumber=8591263","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T21:35:47Z","timestamp":1598218547000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8591263\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/iecon.2018.8591263","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}