{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:23:22Z","timestamp":1730262202005,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/iecon.2018.8591539","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T22:30:15Z","timestamp":1547850615000},"page":"4213-4218","source":"Crossref","is-referenced-by-count":1,"title":["Characterization and Modeling of Low-Cost Contact-Mode Triboelectric Devices for Energy Harvesting"],"prefix":"10.1109","author":[{"given":"Alessandro","family":"Bertacchini","sequence":"first","affiliation":[]},{"given":"Marco","family":"Lasagni","sequence":"additional","affiliation":[]},{"given":"Gabriele","family":"Sereni","sequence":"additional","affiliation":[]},{"given":"Luca","family":"Larcher","sequence":"additional","affiliation":[]},{"given":"Paolo","family":"Pavan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/smll.201400863"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1038\/srep22253"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"206","DOI":"10.1016\/j.sna.2016.05.051","article-title":"A flexible large-area triboelectric generator by low-cost roll-to-roll process for location-based monitoring","volume":"247","author":"cheng","year":"2016","journal-title":"Sens Actuators A Phys"},{"key":"ref13","first-page":"581","article-title":"Floor-based large-area triboelectric generator for active security monitoring","author":"cheng","year":"0","journal-title":"Proc IEEE ICCE"},{"key":"ref14","first-page":"8","article-title":"Comprehensive analysis of deformation of interfacial micronano structure by applied force in triboelectric energy harvester","author":"seol","year":"2014","journal-title":"Proc IEEE IEDM"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/AIM.2015.7222595"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2010.07.005"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2015.7388828"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201700049"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2016.7421858"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2016.2588529"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/24\/10\/104002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MEMSYS.2016.7421552"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2015.2403256"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.nanoen.2016.03.004"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2014.2317718"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1039\/c3ee42571a"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1021\/am404611h"}],"event":{"name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2018,10,21]]},"location":"Washington, DC","end":{"date-parts":[[2018,10,23]]}},"container-title":["IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8560606\/8591058\/08591539.pdf?arnumber=8591539","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T23:01:38Z","timestamp":1598223698000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8591539\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iecon.2018.8591539","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}