{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T00:19:04Z","timestamp":1725668344429},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/iecon.2018.8592928","type":"proceedings-article","created":{"date-parts":[[2019,1,18]],"date-time":"2019-01-18T22:30:15Z","timestamp":1547850615000},"page":"5936-5941","source":"Crossref","is-referenced-by-count":1,"title":["L\u00e9vy Process-Based Stochastic Modeling for Machine Performance Degradation Prognosis"],"prefix":"10.1109","author":[{"given":"Peng","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Robert X.","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","article-title":"Bearing Data Set","author":"lee","year":"2007","journal-title":"NASA Ames Prognostics Data Repository"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1201\/b14835"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2017.2666184"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2740856"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2245658"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2813964"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.02.027"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2012.08.016"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2299155"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.11.011"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-005-5237-8"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.874937"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1115\/1.4032680"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2015.05.011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2017.2666184"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2017.04.012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.probengmech.2016.05.002"},{"journal-title":"L&#x00E9;vy Processes","year":"1996","author":"bertoin","key":"ref29"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677334"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336616"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2393840"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2017.04.014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2739709"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194173"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2033734"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2103710"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cja.2014.12.015"},{"journal-title":"Fluctuations of L&#x00E9;vy Processes with Applications Introductory Lectures","year":"2006","author":"kyprianou","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2170253"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.06.001"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1115\/1.1850534"}],"event":{"name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2018,10,21]]},"location":"D.C., DC, USA","end":{"date-parts":[[2018,10,23]]}},"container-title":["IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8560606\/8591058\/08592928.pdf?arnumber=8592928","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,23]],"date-time":"2020-08-23T23:00:15Z","timestamp":1598223615000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8592928\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/iecon.2018.8592928","relation":{},"subject":[],"published":{"date-parts":[[2018,10]]}}}