{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,15]],"date-time":"2025-10-15T10:25:23Z","timestamp":1760523923194,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/iecon.2019.8927014","type":"proceedings-article","created":{"date-parts":[[2019,12,27]],"date-time":"2019-12-27T21:00:17Z","timestamp":1577480417000},"page":"4095-4100","source":"Crossref","is-referenced-by-count":1,"title":["Characterization of Parasitic Elements in Capacitors for Fast-switching Resonant Converters"],"prefix":"10.1109","author":[{"given":"Martin","family":"Hergt","sequence":"first","affiliation":[]},{"given":"Lukas W.","family":"Mayer","sequence":"additional","affiliation":[]},{"given":"Martin","family":"Sack","sequence":"additional","affiliation":[]},{"given":"Martin","family":"Honsberg","sequence":"additional","affiliation":[]},{"given":"Sebastian","family":"Nielebock","sequence":"additional","affiliation":[]},{"given":"Marc","family":"Hiller","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/EPE.2019.8915041"},{"journal-title":"Datasheet MC22FA102-F CDE Cornell Dubilier","year":"0","key":"ref11"},{"journal-title":"Datasheet C4540C683JDGAC KEMNET","year":"0","key":"ref12"},{"journal-title":"Datasheet 2220Y6300105KXTWS2 Knowles","year":"0","key":"ref13"},{"journal-title":"Maxim Integrated","article-title":"Temperature and Voltage Variation of Ceramic Capacitors, or Why Your 4.7?lF Capacitor Becomes a 0.33?F Capacitor","year":"0","key":"ref14"},{"journal-title":"Large Signal Modelling of GaN Device for High Power Amplifier DEsign","year":"2006","author":"jarndal","key":"ref15"},{"key":"ref16","article-title":"Ein Verfahren zur zuverlässigen experimentellen Modellierung von Mikrowellen- FETs","volume":"9","author":"lin","year":"1993","journal-title":"VDI Verlag"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-8351-9088-7"},{"journal-title":"Chip Monolithic Ceramic Capacitors for Flow\/Reflow Soldering GRM15\/18\/21\/31 Series","year":"0","key":"ref18"},{"journal-title":"Datasheet IXRFD630 IXYSRF","year":"0","key":"ref4"},{"key":"ref3","article-title":"Leistungselektronische Scahltungen","author":"schr\u00f6der","year":"0","journal-title":"Springer-Verlag 3 Auflage"},{"journal-title":"Tektronix","article-title":"TDR Impedance Measurements: A Foundation für Signal Integrity","year":"0","key":"ref6"},{"key":"ref5","volume":"5","author":"brunswig","year":"1998","journal-title":"Hochfrequenztechnik Elektronik und Signal-verarbeitung"},{"key":"ref8","article-title":"Performing Impedance Analysis with the E5061B ENA Vector Network Analyzer","volume":"2","year":"2018","journal-title":"Keysight Technologies"},{"journal-title":"Rohde&Schawarz","article-title":"Messungen an RF- und AF- Filtern mit R&S® Value Instruments","year":"0","key":"ref7"},{"journal-title":"Taschenbuch der Hochfrequenztechnik","year":"1992","author":"gundlach","key":"ref2"},{"journal-title":"Switchmode RF and Microwave Power Amplifiers","year":"2012","author":"grebennikov","key":"ref1"},{"journal-title":"Power semiconductor characterization using Pulse S-Parameter measurements","year":"2019","author":"hergt","key":"ref9"}],"event":{"name":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2019,10,14]]},"location":"Lisbon, Portugal","end":{"date-parts":[[2019,10,17]]}},"container-title":["IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8897531\/8926608\/08927014.pdf?arnumber=8927014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,7,27]],"date-time":"2021-07-27T01:29:20Z","timestamp":1627349360000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8927014\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iecon.2019.8927014","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}