{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T09:58:58Z","timestamp":1764842338312},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/iecon.2019.8927490","type":"proceedings-article","created":{"date-parts":[[2019,12,27]],"date-time":"2019-12-27T21:00:17Z","timestamp":1577480417000},"source":"Crossref","is-referenced-by-count":11,"title":["A Study on Shunt Resistor-based Current Measurements for Fast Switching GaN Devices"],"prefix":"10.1109","author":[{"given":"Thilini","family":"Wickramasinghe","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephane","family":"Azzopardi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bruno","family":"Allard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cyril","family":"Buttay","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Charles","family":"Joubert","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Martin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Fracois","family":"Mogniotte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Herve","family":"Morel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pascal","family":"Bevilacqua","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thanh-Long","family":"Le","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.874493"},{"key":"ref11","article-title":"Medium Power Planar Transformer 1 kW to 3 kW","author":"vishay","year":"2017","journal-title":"PLA51 datasheet"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2016.0344"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2015.7309419"},{"key":"ref14","first-page":"1","article-title":"Investigation of Neel Effect technology for current sensors in next-generation aeronautical applications","author":"bouzourene","year":"0","journal-title":"Proc 2011–14th Power Electronics and Applications (EPE 2011) Conference"},{"key":"ref15","article-title":"Series SDN-414","year":"0","journal-title":"SDN-414-025 specifications"},{"key":"ref16","year":"0","journal-title":"LTspice Model User Guide"},{"key":"ref4","article-title":"Shunt resistors for precision current measurement, presented at ECPE Workshop","author":"schiffner","year":"0","journal-title":"Hamburg Germany Proceedings"},{"key":"ref3","article-title":"Challenges and solutions of high-side current and of phase current measurement","author":"strzalkowski","year":"0","journal-title":"presented at ECPE Workshop Hamburg Germany"},{"key":"ref6","first-page":"1251","article-title":"An overview of integratable current sensor technologies","author":"xiao","year":"0","journal-title":"Proc 38th IAS Annual Meeting Industry Applications Conference"},{"key":"ref5","first-page":"1","article-title":"Optimisation of Shunt Resistors for Fast Transients","author":"adelmund","year":"0","journal-title":"PCIM Europe 2016 International Exhibition and Conference for Power Electronics Intelligent Motion Renewable Energy and Energy Management"},{"key":"ref8","article-title":"Wide-Bandwith Rogowski based Measurement in the Lab","author":"hewson","year":"0","journal-title":"presented at ECPE Workshop Hamburg Germany"},{"key":"ref7","article-title":"Dimensioning of a proper coaxial shunt type","author":"billmann","year":"0","journal-title":"presented at ECPE Workshop Hamburg Germany"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2009.2013914"},{"key":"ref1","article-title":"Current sensing solutions for power supply designers","author":"mammano","year":"0","journal-title":"Proc TI Power Supply Design Sem"},{"key":"ref9","article-title":"Case Study - “High Bandwith and Minimal Invasive Current Measurement","author":"denk","year":"0","journal-title":"ECPE Workshop Hamburg Germany"}],"event":{"name":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society","location":"Lisbon, Portugal","start":{"date-parts":[[2019,10,14]]},"end":{"date-parts":[[2019,10,17]]}},"container-title":["IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8897531\/8926608\/08927490.pdf?arnumber=8927490","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T06:06:39Z","timestamp":1598249199000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8927490\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/iecon.2019.8927490","relation":{},"subject":[],"published":{"date-parts":[[2019,10]]}}}