{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,11]],"date-time":"2026-02-11T18:18:41Z","timestamp":1770833921397,"version":"3.50.1"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,10,18]],"date-time":"2020-10-18T00:00:00Z","timestamp":1602979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,18]],"date-time":"2020-10-18T00:00:00Z","timestamp":1602979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004608","name":"Natural Science Foundation of Jiangsu Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004608","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10,18]]},"DOI":"10.1109\/iecon43393.2020.9254519","type":"proceedings-article","created":{"date-parts":[[2020,11,18]],"date-time":"2020-11-18T21:55:32Z","timestamp":1605736532000},"page":"5302-5307","source":"Crossref","is-referenced-by-count":4,"title":["Statistical Multi-Faults Localization Strategy of Switch Open-Circuit Fault for Modular Multilevel Converters Using Grubbs Criterion"],"prefix":"10.1109","author":[{"given":"Ming","family":"Jin","sequence":"first","affiliation":[]},{"given":"Fujin","family":"Deng","sequence":"additional","affiliation":[]},{"given":"Chengkai","family":"Liu","sequence":"additional","affiliation":[]},{"given":"Qiang","family":"Yu","sequence":"additional","affiliation":[]},{"given":"Jifeng","family":"Zhao","sequence":"additional","affiliation":[]},{"given":"Qingsong","family":"Wang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"1242","article-title":"Review of fault diagnosis and fault-tolerant control for modular multilevel converter of HVDC","author":"liu","year":"2013","journal-title":"Proc IECON"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2538201"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2348194"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2462717"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2526684"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"2700","DOI":"10.1109\/TIE.2009.2036019","article-title":"Fault-tolerant design and control strategy for cascaded H-bridge multilevel converter-based STATCOM","volume":"57","author":"song","year":"2010","journal-title":"IEEE Trans Ind Electron"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2849441"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/RTEICT42901.2018.9012352"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2943916"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2019.0957"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2880137"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2310127"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2303297"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2866787"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2616721"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2562103"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2309937"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2682105"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2211315"}],"event":{"name":"IECON 2020 - 46th Annual Conference of the IEEE Industrial Electronics Society","location":"Singapore","start":{"date-parts":[[2020,10,18]]},"end":{"date-parts":[[2020,10,21]]}},"container-title":["IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9254213\/9254215\/09254519.pdf?arnumber=9254519","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:42:32Z","timestamp":1659483752000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9254519\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,18]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iecon43393.2020.9254519","relation":{},"subject":[],"published":{"date-parts":[[2020,10,18]]}}}