{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T10:00:26Z","timestamp":1764842426733,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,10,18]],"date-time":"2020-10-18T00:00:00Z","timestamp":1602979200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,10,18]],"date-time":"2020-10-18T00:00:00Z","timestamp":1602979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,18]],"date-time":"2020-10-18T00:00:00Z","timestamp":1602979200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000287","name":"Royal Academy of Engineering","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000287","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10,18]]},"DOI":"10.1109\/iecon43393.2020.9255039","type":"proceedings-article","created":{"date-parts":[[2020,11,18]],"date-time":"2020-11-18T21:55:32Z","timestamp":1605736532000},"page":"4717-4724","source":"Crossref","is-referenced-by-count":19,"title":["Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices"],"prefix":"10.1109","author":[{"given":"Jun","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xibo","family":"Yuan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Navid","family":"Rasekh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984985"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/63.45998"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2162252"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2010.5433375"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.1978.7072358"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/tee.21908"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2955055"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2573273"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2286830"},{"journal-title":"High-Frequency Magnetic Components","year":"2014","author":"marian","key":"ref19"},{"article-title":"Testing core loss for rectangular waveforms","year":"2010","author":"sullivan","key":"ref4"},{"key":"ref3","first-page":"572","article-title":"A practical approach for magnetic core-loss characterization","volume":"10","author":"tan","year":"1995","journal-title":"IEEE Transactions on Power Electronics"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2018436"},{"article-title":"Testing core loss for rectangular waveforms, phase II supplemental report","year":"2012","author":"herbert","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2453055"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2867264"},{"key":"ref2","first-page":"36","article-title":"Accurate prediction of ferrite core loss with nonsimisoidal waveforms using only steinmetz parameters","author":"venkatachalam","year":"2002","journal-title":"Proc IEEE Workshop on Computers in Power Electronics"},{"year":"2014","key":"ref1","article-title":"Determining Switching Losses of SEMIKRON IGBT Modules"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2019.8722114"}],"event":{"name":"IECON 2020 - 46th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2020,10,18]]},"location":"Singapore, Singapore","end":{"date-parts":[[2020,10,21]]}},"container-title":["IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9254213\/9254215\/09255039.pdf?arnumber=9255039","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T21:57:06Z","timestamp":1656453426000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9255039\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,18]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iecon43393.2020.9255039","relation":{},"subject":[],"published":{"date-parts":[[2020,10,18]]}}}