{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T23:02:53Z","timestamp":1725577373828},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,13]]},"DOI":"10.1109\/iecon48115.2021.9589114","type":"proceedings-article","created":{"date-parts":[[2021,11,10]],"date-time":"2021-11-10T23:47:51Z","timestamp":1636588071000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Sequence-To-Sequence Health Index Estimation of Rolling Bearings with Long-Short Term Memory and Transfer Learning"],"prefix":"10.1109","author":[{"given":"Tarek","family":"Berghout","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohamed","family":"Benbouzid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Leila-Hayet","family":"Mouss","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2882682"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/en14082163"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.107227"},{"key":"ref13","first-page":"1","article-title":"A deformable CNN-DLSTM based transfer learning method for fault diagnosis of rolling bearing under multiple working conditions","author":"wang","year":"2020","journal-title":"Int J Prod Res"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-210503"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/app8071102"},{"key":"ref16","first-page":"1","article-title":"PRONOSTIA?: An Experimental Platform for Bearings Accelerated Degradation Tests","author":"nectoux","year":"2012","journal-title":"IEEE International Conference on Prognostics and Health Management PHM’12"},{"journal-title":"The Prognostics Center of Excellence","year":"0","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2014.09.003"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/8240168"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TLA.2021.9443066"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/app10165542"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.108973"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s11042-020-10411-9"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-021-02503-2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.109166"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3085909"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2966582"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2021.101247"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s10766-019-00650-1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.11.011"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2019.105919"}],"event":{"name":"IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2021,10,13]]},"location":"Toronto, ON, Canada","end":{"date-parts":[[2021,10,16]]}},"container-title":["IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9588332\/9589036\/09589114.pdf?arnumber=9589114","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:49:59Z","timestamp":1652201399000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9589114\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,13]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iecon48115.2021.9589114","relation":{},"subject":[],"published":{"date-parts":[[2021,10,13]]}}}