{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:18:15Z","timestamp":1730261895623,"version":"3.28.0"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,13]]},"DOI":"10.1109\/iecon48115.2021.9589133","type":"proceedings-article","created":{"date-parts":[[2021,11,10]],"date-time":"2021-11-10T23:47:51Z","timestamp":1636588071000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A Novel Converter-level Si Material Degradation Monitoring Method Based on the DC Bus Leakage Current"],"prefix":"10.1109","author":[{"given":"Qinghao","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Geye","family":"Lu","sequence":"additional","affiliation":[]},{"given":"Pinjia","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/TPEL.2016.2621757"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/S0026-2714(02)00042-2"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/APEC.2014.6803662"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1049\/cp.2019.0326"},{"key":"ref11","first-page":"183","article-title":"Study on IGBT health status monitoring method based on collector leakage current [J]","volume":"32","author":"binli","year":"2017","journal-title":"Transactions of China Electrotechnical Society"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/ECCE.2018.8558118"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1007\/978-0-387-47314-7"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TPEL.2016.2628705"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ACCESS.2019.2909928"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/TIA.2011.2124436"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/IRPS.2017.7936371"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/PESGM.2012.6345317"}],"event":{"name":"IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2021,10,13]]},"location":"Toronto, ON, Canada","end":{"date-parts":[[2021,10,16]]}},"container-title":["IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9588332\/9589036\/09589133.pdf?arnumber=9589133","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:50:00Z","timestamp":1652201400000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9589133\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,13]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iecon48115.2021.9589133","relation":{},"subject":[],"published":{"date-parts":[[2021,10,13]]}}}