{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T06:17:02Z","timestamp":1757312222700,"version":"3.37.3"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020487","name":"Nature","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100020487","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,13]]},"DOI":"10.1109\/iecon48115.2021.9589895","type":"proceedings-article","created":{"date-parts":[[2021,11,10]],"date-time":"2021-11-10T23:47:51Z","timestamp":1636588071000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Reduced-order Modeling and Dynamic Stability Analysis of DC Systems Connected to Weak Grids in DC Voltage Control Timescale"],"prefix":"10.1109","author":[{"given":"Pengfei","family":"Li","sequence":"first","affiliation":[{"name":"Tianjin University,Key Laboratory of Smart Grid of Ministry of Education,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Guo","sequence":"additional","affiliation":[{"name":"Tianjin University,Key Laboratory of Smart Grid of Ministry of Education,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xialin","family":"Li","sequence":"additional","affiliation":[{"name":"Tianjin University,Key Laboratory of Smart Grid of Ministry of Education,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chen","family":"Zhang","sequence":"additional","affiliation":[{"name":"Tianjin University,Key Laboratory of Smart Grid of Ministry of Education,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lin","family":"Zhu","sequence":"additional","affiliation":[{"name":"Tianjin University,Key Laboratory of Smart Grid of Ministry of Education,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ye","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of HVDC Electric Power Research Institute,CSG Guangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2825391"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2982498"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2330518"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"445","DOI":"10.1109\/JESTPE.2015.2480859","article-title":"DC-bus Voltage Control Stability Affected by Ac-Bus Voltage Control in VSCs Connected to Weak AC Grids","volume":"4","author":"yuan","year":"2016","journal-title":"IEEE Journal of Emerging and Selected Topics in Power Electronics"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2019.02350"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2017.2653939"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3076438"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2790945"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2016.2592680"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2019.2914318"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2712692"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3005777"}],"event":{"name":"IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2021,10,13]]},"location":"Toronto, ON, Canada","end":{"date-parts":[[2021,10,16]]}},"container-title":["IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9588332\/9589036\/09589895.pdf?arnumber=9589895","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,2]],"date-time":"2024-10-02T18:20:42Z","timestamp":1727893242000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9589895\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,13]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iecon48115.2021.9589895","relation":{},"subject":[],"published":{"date-parts":[[2021,10,13]]}}}