{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T07:47:26Z","timestamp":1772264846364,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,13]],"date-time":"2021-10-13T00:00:00Z","timestamp":1634083200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,13]]},"DOI":"10.1109\/iecon48115.2021.9589912","type":"proceedings-article","created":{"date-parts":[[2021,11,10]],"date-time":"2021-11-10T18:47:51Z","timestamp":1636570071000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Knowledge driven rapid development of white box digital twins for industrial plant systems"],"prefix":"10.1109","author":[{"given":"Amar","family":"B.","sequence":"first","affiliation":[]},{"given":"Subhrojyoti","family":"R.C.","sequence":"additional","affiliation":[]},{"given":"Barnali","family":"B.","sequence":"additional","affiliation":[]},{"given":"R.","family":"Dhakshinamoorthy","sequence":"additional","affiliation":[]},{"given":"Seenivasan","family":"A.","sequence":"additional","affiliation":[]},{"given":"Naveenkumar","family":"S.","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0224-5"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.fusengdes.2016.05.024"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1567274.1567278"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-42816-1_5"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-45234-9_29"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2012.6227239"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"2141","DOI":"10.1007\/s11036-020-01557-9","article-title":"Design and Development of Digital Twins: a Case Study in Supply Chains","volume":"25","author":"antonio marmolejo-saucedo","year":"2020","journal-title":"Mobile Networks and Applications"},{"key":"ref3","first-page":"291","article-title":"Knowledge-based Engineering of Automation Systems using Ontologies and Engineering Data","author":"glawe","year":"2015","journal-title":"KEOD"},{"key":"ref6","first-page":"374","article-title":"A simulation-based architecture for smart cyber-physical systems","author":"gabor","year":"2016","journal-title":"IEEE ICAC 2016"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"3920","DOI":"10.1080\/00207543.2018.1552032","article-title":"Digital Twin for rotating machinery fault diagnosis in smart manufacturing","volume":"57 12","author":"wang","year":"2019","journal-title":"IJPR"},{"key":"ref8","first-page":"209","article-title":"Next generation digital twin","author":"boschert","year":"2018","journal-title":"Proc tmce Las Palmas de Gran Canaria"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2019.04.084"},{"key":"ref2","first-page":"2004","article-title":"OWL web ontology language overview","volume":"10 10","author":"mcguinness","year":"2004","journal-title":"W3C Recommendation"},{"key":"ref1","first-page":"3387","article-title":"Modeling of discrete event systems using finite automata with variables","author":"skoldstam","year":"2007","journal-title":"46th IEEE CDC 2007"},{"key":"ref9","first-page":"215","article-title":"Toward a unified English-like representation of semantic models, data, and graph patterns for subject matter experts","volume":"7 3","author":"crapo","year":"2013","journal-title":"IJSC"}],"event":{"name":"IECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society","location":"Toronto, ON, Canada","start":{"date-parts":[[2021,10,13]]},"end":{"date-parts":[[2021,10,16]]}},"container-title":["IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9588332\/9589036\/09589912.pdf?arnumber=9589912","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T12:50:06Z","timestamp":1652187006000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9589912\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,13]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iecon48115.2021.9589912","relation":{},"subject":[],"published":{"date-parts":[[2021,10,13]]}}}