{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:24:09Z","timestamp":1730262249104,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,17]],"date-time":"2022-10-17T00:00:00Z","timestamp":1665964800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,17]],"date-time":"2022-10-17T00:00:00Z","timestamp":1665964800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,17]]},"DOI":"10.1109\/iecon49645.2022.9968436","type":"proceedings-article","created":{"date-parts":[[2022,12,9]],"date-time":"2022-12-09T13:45:34Z","timestamp":1670593534000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["GA-based Parameter Optimization of Image Processing for Contamination Inspection of Nonwoven Fabrics"],"prefix":"10.1109","author":[{"given":"Nobuhiko","family":"Kumazawa","sequence":"first","affiliation":[{"name":"Gifu University,Department of Mechanical Engineering,Gifu,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sota","family":"Miyazaki","sequence":"additional","affiliation":[{"name":"Gifu University,Department of Mechanical Engineering,Gifu,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoshiyuki","family":"Hatta","sequence":"additional","affiliation":[{"name":"Gifu University,Intelligent Production Technology R & D Center For Aerospace,Gifu,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junya","family":"Sato","sequence":"additional","affiliation":[{"name":"Gifu University,Department of Mechanical Engineering,Gifu,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kazuaki","family":"Ito","sequence":"additional","affiliation":[{"name":"Gifu University,Department of Mechanical Engineering,Gifu,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yukio","family":"Otsuka","sequence":"additional","affiliation":[{"name":"Otsuka Corporation,Hashima,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ryota","family":"Kitagawa","sequence":"additional","affiliation":[{"name":"Otsuka Corporation,Hashima,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kenji","family":"Iwata","sequence":"additional","affiliation":[{"name":"Otsuka Corporation,Hashima,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hidekazu","family":"Hirayu","sequence":"additional","affiliation":[{"name":"Gifu Prefectural Industrial Technology Center,Seki,Japan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2899555"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2004.825286"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2366977"},{"key":"ref6","article-title":"Genetic Algorithms in Search","author":"goldberg","year":"1989","journal-title":"Optimization and Machine Learning"},{"key":"ref5","first-page":"5","author":"kitano","year":"1993","journal-title":"Genetic Algorithm"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICIAP.2001.957060"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICDAR.2005.86"},{"key":"ref2","article-title":"Measurement and Acquisition of Manufacturing Skill","author":"matsuki","year":"2009","journal-title":"Proceedings of 2009 Japan Society for Precision Engineering Fall Meeting"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SICE.1997.625001"},{"key":"ref1","first-page":"889","article-title":"Recent Trends and Future Developments in Automated Systems","volume":"54","author":"inoue","year":"2015","journal-title":"Measurement and Control"}],"event":{"name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2022,10,17]]},"location":"Brussels, Belgium","end":{"date-parts":[[2022,10,20]]}},"container-title":["IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9968313\/9968303\/09968436.pdf?arnumber=9968436","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,26]],"date-time":"2022-12-26T14:37:32Z","timestamp":1672065452000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9968436\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,17]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iecon49645.2022.9968436","relation":{},"subject":[],"published":{"date-parts":[[2022,10,17]]}}}