{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T21:27:39Z","timestamp":1767994059146,"version":"3.49.0"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,17]],"date-time":"2022-10-17T00:00:00Z","timestamp":1665964800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,17]],"date-time":"2022-10-17T00:00:00Z","timestamp":1665964800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,17]]},"DOI":"10.1109\/iecon49645.2022.9968716","type":"proceedings-article","created":{"date-parts":[[2022,12,9]],"date-time":"2022-12-09T18:45:34Z","timestamp":1670611534000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Online Interturn Short Circuits Fault Monitoring for Permanent Magnet Synchronous Machines"],"prefix":"10.1109","author":[{"given":"Ying","family":"Zuo","sequence":"first","affiliation":[{"name":"Concordia University,Department of Electrical and Computer Engineering,Montreal,Canada"}]},{"given":"Ahmad","family":"Darabi","sequence":"additional","affiliation":[{"name":"Concordia University,Department of Electrical and Computer Engineering,Montreal,Canada"}]},{"given":"Chunyan","family":"Lai","sequence":"additional","affiliation":[{"name":"Concordia University,Department of Electrical and Computer Engineering,Montreal,Canada"}]},{"given":"K.","family":"Lakshmi Varaha Iyer","sequence":"additional","affiliation":[{"name":"Magna International Inc.,Corporate R&D and Engineering,Troy,MI,USA"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2688973"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.23919\/CJEE.2015.7933135"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/ICEMS50442.2020.9291118"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/2943.715501"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2198077"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2496900"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2811538"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2944413"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2018.2819627"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ESARS.2015.7101528"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096906"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2002.805611"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2015.2470092"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2003.815832"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2583780"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2929145"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7854890"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2993235"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2011.2177873"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2968414"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2879281"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/TEMS.2018.8326451"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC.2014.6861775"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2015.0020"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2050496"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2019.2913357"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2318207"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2499162"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847964"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007529"}],"event":{"name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","location":"Brussels, Belgium","start":{"date-parts":[[2022,10,17]]},"end":{"date-parts":[[2022,10,20]]}},"container-title":["IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9968313\/9968303\/09968716.pdf?arnumber=9968716","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,26]],"date-time":"2022-12-26T19:40:38Z","timestamp":1672083638000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9968716\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,17]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/iecon49645.2022.9968716","relation":{},"subject":[],"published":{"date-parts":[[2022,10,17]]}}}