{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:26:26Z","timestamp":1740101186248,"version":"3.37.3"},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,10,17]],"date-time":"2022-10-17T00:00:00Z","timestamp":1665964800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,17]],"date-time":"2022-10-17T00:00:00Z","timestamp":1665964800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000883","name":"University of Bristol","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000883","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,10,17]]},"DOI":"10.1109\/iecon49645.2022.9968773","type":"proceedings-article","created":{"date-parts":[[2022,12,9]],"date-time":"2022-12-09T18:45:34Z","timestamp":1670611534000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["An Integrated Testbed with Single DC Source for Delivering Symmetrical Square-Wave Excitation Voltage in the Triple Pulse Test"],"prefix":"10.1109","author":[{"given":"William","family":"Black","sequence":"first","affiliation":[{"name":"University of Bristol Bristol,Department of Electrical and Electronic Engineering,United Kingdom"}]},{"given":"Jun","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Bristol Bristol,Department of Electrical and Electronic Engineering,United Kingdom"}]},{"given":"Xibo","family":"Yuan","sequence":"additional","affiliation":[{"name":"University of Bristol Bristol,Department of Electrical and Electronic Engineering,United Kingdom"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/CIPE.2002.1196712"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"2203","DOI":"10.1109\/IAS.2001.955931","article-title":"Improved calculation of core loss with nonsinusoidal waveforms","volume":"4","author":"li","year":"2001","journal-title":"Conference Record of the 2001 IEEE Industry Applications Conference 36th IAS Annual Meeting (Cat No 01CH37248)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9255039"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2867264"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.1996.548774"},{"year":"2014","key":"ref1","article-title":"Determining switching losses of SEMIKRON IGBT modules"}],"event":{"name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2022,10,17]]},"location":"Brussels, Belgium","end":{"date-parts":[[2022,10,20]]}},"container-title":["IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9968313\/9968303\/09968773.pdf?arnumber=9968773","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,26]],"date-time":"2022-12-26T19:40:33Z","timestamp":1672083633000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9968773\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10,17]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/iecon49645.2022.9968773","relation":{},"subject":[],"published":{"date-parts":[[2022,10,17]]}}}