{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:21:07Z","timestamp":1730262067803,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001843","name":"Science and Engineering Research Board","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001843","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,16]]},"DOI":"10.1109\/iecon51785.2023.10312218","type":"proceedings-article","created":{"date-parts":[[2023,11,16]],"date-time":"2023-11-16T18:52:10Z","timestamp":1700160730000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Improved Module Power and Loss Balancing Through Carrier-Reassignment PWM in a 17-Level CHB-Based EV Charger"],"prefix":"10.1109","author":[{"given":"Little","family":"Pradhan","sequence":"first","affiliation":[{"name":"Indian Institute of Technology (IIT),Department of Electrical Engineering,Dharwad,Karnataka,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Renuka","family":"Varma","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology (IIT),Department of Electrical Engineering,Dharwad,Karnataka,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Venkatramanan","sequence":"additional","affiliation":[{"name":"University of Minnesota,Department of Electrical and Computer Engineering,Minneapolis,MN,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Prince","family":"Kumar","sequence":"additional","affiliation":[{"name":"Renesas Electronics,Durham,NC,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ned","family":"Mohan","sequence":"additional","affiliation":[{"name":"University of Minnesota,Department of Electrical and Computer Engineering,Minneapolis,MN,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhijit","family":"Kshirsagar","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology (IIT),Department of Electrical Engineering,Dharwad,Karnataka,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MPE.2011.941320"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2012.6342356"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MPE.2009.935553"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2019.2958709"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2019.8912594"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC53557.2022.9813825"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2012.6389427"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IECON48115.2021.9589396"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2669084"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2002.801073"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3103610"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2658182"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PEDES.2018.8707812"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IECON49645.2022.9968353"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/9781118844779"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/i-PACT52855.2021.9696676"},{"journal-title":"650 V, 50 mR Gallium Nitride (GaN) FET, 2020","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2694381"},{"key":"ref19","article-title":"Understanding diode reverse recovery and its effect on switching losses","volume":"2007","author":"Haaf","year":"2007","journal-title":"Fairchild Power Seminar"}],"event":{"name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2023,10,16]]},"location":"Singapore, Singapore","end":{"date-parts":[[2023,10,19]]}},"container-title":["IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10311571\/10311610\/10312218.pdf?arnumber=10312218","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T02:16:56Z","timestamp":1710382616000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10312218\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,16]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iecon51785.2023.10312218","relation":{},"subject":[],"published":{"date-parts":[[2023,10,16]]}}}