{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T16:06:28Z","timestamp":1774541188734,"version":"3.50.1"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,16]]},"DOI":"10.1109\/iecon51785.2023.10312239","type":"proceedings-article","created":{"date-parts":[[2023,11,16]],"date-time":"2023-11-16T13:52:10Z","timestamp":1700142730000},"page":"01-09","source":"Crossref","is-referenced-by-count":1,"title":["Background-Adaptive Surface Defect Detection Neural Networks via Positive Samples"],"prefix":"10.1109","author":[{"given":"Tongzhi","family":"Niu","sequence":"first","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Biao","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhenrong","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruoqi","family":"Zhang","sequence":"additional","affiliation":[{"name":"China-EU Institute for Clean and Renewable Energy, Huazhong University of Science and Technology,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bin","family":"Li","sequence":"additional","affiliation":[{"name":"School of Mechanical Science and Engineering, Huazhong University of Science and Technology,Wuhan,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref12","article-title":"An image is worth 16x16 words: Transformers for image recognition at scale","author":"dosovitskiy","year":"2020","journal-title":"ArXiv Preprint"},{"key":"ref15","first-page":"2096","article-title":"Domain-adversarial training of neural networks","volume":"17","author":"ganin","year":"2016","journal-title":"The Journal of Machine Learning Research"},{"key":"ref14","first-page":"1","article-title":"Retinanet with difference channel attention and adaptively spatial feature fusion for steel surface defect detection","volume":"70","author":"cheng","year":"2020","journal-title":"IEEE Transactions on Instrumentation and Measurement"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00813"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00745"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3230426"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2958826"},{"key":"ref17","first-page":"20 612","article-title":"Adversarial style mining for one-shot unsupervised domain adaptation","volume":"33","author":"luo","year":"2020","journal-title":"Advances in neural information processing systems"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.244"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2023.103978"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.324"},{"key":"ref24","article-title":"Ccnet: Criss-cross attention for semantic segmentation","author":"huang","year":"2020","journal-title":"IEEE Transactions on Pattern Analysis and Machine Intelligence"},{"key":"ref23","first-page":"801","article-title":"Encoder-decoder with atrous separable convolution for semantic image segmentation","author":"chen","year":"0","journal-title":"Proceedings of the European Conference on Computer Vision (ECCV)"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00326"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2019.04.025"},{"key":"ref20","first-page":"234","article-title":"U-net: Convolutional networks for biomedical image segmentation","author":"ronneberger","year":"2015","journal-title":"Medical Image Computing and Computer-Assisted Intervention-MICCAI 2015 18th International Conference"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2644615"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298965"},{"key":"ref27","first-page":"205","article-title":"Swin-unet: Unet-like pure transformer for medical image segmentation","author":"cao","year":"2022","journal-title":"Computer Vision-ECCV 2022 Workshops Tel Aviv"},{"key":"ref8","article-title":"Spatial transformer networks","volume":"28","author":"jaderberg","year":"2015","journal-title":"Advances in neural information processing systems"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00199"},{"key":"ref9","article-title":"Recurrent models of visual attention","volume":"27","author":"mnih","year":"2014","journal-title":"Advances in neural information processing systems"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3233654"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3083561"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3154814"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-32248-9_94"}],"event":{"name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","location":"Singapore, Singapore","start":{"date-parts":[[2023,10,16]]},"end":{"date-parts":[[2023,10,19]]}},"container-title":["IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10311571\/10311610\/10312239.pdf?arnumber=10312239","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,29]],"date-time":"2023-11-29T12:58:30Z","timestamp":1701262710000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10312239\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,16]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/iecon51785.2023.10312239","relation":{},"subject":[],"published":{"date-parts":[[2023,10,16]]}}}