{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,28]],"date-time":"2026-03-28T17:07:39Z","timestamp":1774717659807,"version":"3.50.1"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,16]]},"DOI":"10.1109\/iecon51785.2023.10312334","type":"proceedings-article","created":{"date-parts":[[2023,11,16]],"date-time":"2023-11-16T18:52:10Z","timestamp":1700160730000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Detection of Weak Fault Signature in PMSM Stator Current : A Case Study of Bearing Inner Raceway Fault"],"prefix":"10.1109","author":[{"given":"Saptarshi Pal","family":"Chaudhuri","sequence":"first","affiliation":[{"name":"IIT Kharagpur,Department of Electrical Engineering,Kharagpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aurobinda","family":"Routray","sequence":"additional","affiliation":[{"name":"IIT Kharagpur,Department of Electrical Engineering,Kharagpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Siddhartha","family":"Mukhopadhyay","sequence":"additional","affiliation":[{"name":"IIT Kharagpur,Department of Electrical Engineering,Kharagpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Satarupa","family":"Uttarkabat","sequence":"additional","affiliation":[{"name":"IIT Kharagpur,Department of Electrical Engineering,Kharagpur,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.04.021"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.917108"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2013.6495676"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2049623"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2736510"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3103287"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2016.07.004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3047433"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2019.107384"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2014.2366638"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.4018\/978-1-5225-0084-1.ch020"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2540941"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2737879"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LES.2017.2734798"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.04.035"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/41.873206"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2090839"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2008.4522708"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2006.347599"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2007.4460324"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.911960"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2007.896522"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2011.03.014"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/22\/5\/055701"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2015.7281580"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/28.753640"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/74.370583"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP40776.2020.9053507"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.1017717"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1186\/s12859-018-2473-y"}],"event":{"name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","location":"Singapore, Singapore","start":{"date-parts":[[2023,10,16]]},"end":{"date-parts":[[2023,10,19]]}},"container-title":["IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10311571\/10311610\/10312334.pdf?arnumber=10312334","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,2]],"date-time":"2024-03-02T15:40:50Z","timestamp":1709394050000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10312334\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,16]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/iecon51785.2023.10312334","relation":{},"subject":[],"published":{"date-parts":[[2023,10,16]]}}}