{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T19:47:47Z","timestamp":1725738467154},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,16]],"date-time":"2023-10-16T00:00:00Z","timestamp":1697414400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,16]]},"DOI":"10.1109\/iecon51785.2023.10312619","type":"proceedings-article","created":{"date-parts":[[2023,11,16]],"date-time":"2023-11-16T18:52:10Z","timestamp":1700160730000},"page":"1-7","source":"Crossref","is-referenced-by-count":0,"title":["A Phase Current Reconstruction Method for Open-End Winding Permanent Magnet Synchronous Machine to Reduce Immeasurable Regions of High Modulation"],"prefix":"10.1109","author":[{"given":"Shuo","family":"Huang","sequence":"first","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University,Xi'an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guangzhao","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University,Xi'an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenqing","family":"Guan","sequence":"additional","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University,Xi'an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunqiang","family":"Liu","sequence":"additional","affiliation":[{"name":"Hangzhou Institute of Technology, Xidian University,Hangzhou,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mengbo","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University,Xi'an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhe","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Automation, Northwestern Polytechnical University,Xi'an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2955409"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3195615"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2022.3228544"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2520999"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2021.3113606"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE50734.2022.9947456"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3087015"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CEECT50755.2020.9298620"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2123854"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2009451"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2266408"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3135338"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.1997.648991"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2856372"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2952402"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2935295"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2021.3069891"}],"event":{"name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2023,10,16]]},"location":"Singapore, Singapore","end":{"date-parts":[[2023,10,19]]}},"container-title":["IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10311571\/10311610\/10312619.pdf?arnumber=10312619","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,14]],"date-time":"2024-03-14T02:15:01Z","timestamp":1710382501000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10312619\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,16]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iecon51785.2023.10312619","relation":{},"subject":[],"published":{"date-parts":[[2023,10,16]]}}}