{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,12]],"date-time":"2025-03-12T04:17:08Z","timestamp":1741753028863,"version":"3.38.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,3]]},"DOI":"10.1109\/iecon55916.2024.10905162","type":"proceedings-article","created":{"date-parts":[[2025,3,10]],"date-time":"2025-03-10T17:32:07Z","timestamp":1741627927000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Data-driven Degradation-Aware Model Predictive Control for Power Electronics"],"prefix":"10.1109","author":[{"given":"QiAn","family":"He","sequence":"first","affiliation":[{"name":"Aalborg University,Department of Energy,Aalborg,Denmark"}]},{"given":"Junyan","family":"Shao","sequence":"additional","affiliation":[{"name":"Aalborg University,Department of Energy,Aalborg,Denmark"}]},{"given":"Juan C.","family":"Vasquez","sequence":"additional","affiliation":[{"name":"Aalborg University,Department of Energy,Aalborg,Denmark"}]},{"given":"Baoze","family":"Wei","sequence":"additional","affiliation":[{"name":"Aalborg University,Department of Energy,Aalborg,Denmark"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.107744"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3024914"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2018.09.005"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-control-053018-023825"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2020.106886"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2020.08.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.36001\/phmconf.2011.v3i1.1995"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2929111"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2839938"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2991454"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109660"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2021.3055145"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2829624"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2024.3350575"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC47953.2021.9449497"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3270640"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2015750"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2969116"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.36001\/phmconf.2010.v2i1.1761"}],"event":{"name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2024,11,3]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2024,11,6]]}},"container-title":["IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10904979\/10905066\/10905162.pdf?arnumber=10905162","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T05:17:19Z","timestamp":1741670239000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10905162\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,3]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iecon55916.2024.10905162","relation":{},"subject":[],"published":{"date-parts":[[2024,11,3]]}}}