{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T10:09:41Z","timestamp":1764842981147,"version":"3.38.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,3]]},"DOI":"10.1109\/iecon55916.2024.10905334","type":"proceedings-article","created":{"date-parts":[[2025,3,10]],"date-time":"2025-03-10T17:32:07Z","timestamp":1741627927000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Predicting DC-Link Capacitor Current Ripple in AC-DC Rectifier Circuits Using Fine-Tuned Large Language Models"],"prefix":"10.1109","author":[{"given":"Mohamed","family":"Zeid","sequence":"first","affiliation":[{"name":"Texas A&M University,Power Electronics & Power Quality Laboratory,Dept of ECE,College Station,TX,77845"}]},{"given":"Subir","family":"Majumder","sequence":"additional","affiliation":[{"name":"Texas A&M University,Power Electronics & Power Quality Laboratory,Dept of ECE,College Station,TX,77845"}]},{"given":"Hasan","family":"Ibrahim","sequence":"additional","affiliation":[{"name":"Texas A&M University,Power Electronics & Power Quality Laboratory,Dept of ECE,College Station,TX,77845"}]},{"given":"Prasad","family":"Enjeti","sequence":"additional","affiliation":[{"name":"Texas A&M University,Power Electronics & Power Quality Laboratory,Dept of ECE,College Station,TX,77845"}]},{"given":"Le","family":"Xie","sequence":"additional","affiliation":[{"name":"Texas A&M University,Power Electronics & Power Quality Laboratory,Dept of ECE,College Station,TX,77845"}]},{"given":"Chao","family":"Tian","sequence":"additional","affiliation":[{"name":"Texas A&M University,Power Electronics & Power Quality Laboratory,Dept of ECE,College Station,TX,77845"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3024914"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1039\/D3DD00113J","article-title":"14 examples of how llms can transform materials science and chemistry: A reflection on a large language model hackathon","author":"Jablonka","year":"2023"},{"key":"ref3","article-title":"Chipnemo: Domain-adapted llms for chip design","volume-title":"NVIDIA Research","author":"Liu","year":"2023"},{"article-title":"Llm4eda: Emerging progress in large language models for electronic design automation","year":"2023","author":"Zhong","key":"ref4"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1109\/ECCE55643.2024.10861072","article-title":"Pe-gpt: A physics-informed interactive large language model for power converter modulation design","author":"Lin","year":"2024"},{"article-title":"Large foundation models for power systems","year":"2023","author":"Huang","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.joule.2024.05.009"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1109\/TSG.2024.3373256","article-title":"Applying large language models to power systems: Potential security threats","author":"Ruan","year":"2024"},{"key":"ref9","doi-asserted-by":"crossref","DOI":"10.1109\/PESGM51994.2024.10688863","article-title":"Chatgpt and other large language models for cybersecurity of smart grid applications","author":"Zaboli","year":"2024"},{"first-page":"112","volume-title":"Global power factor correction devices market report, history and forecast 2017-2028, breakdown data by companies, key regions, types and application. SKU ID: QYR-21058765","year":"2022","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2228279"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2126533"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/NAPS.2010.5618955"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICC61519.2023.10442383"},{"key":"ref15","first-page":"9751","article-title":"Tart: A plug-and-play transformer module for task-agnostic reasoning","volume":"36","author":"Bhatia","year":"2023","journal-title":"Advances in Neural Information Processing Systems"},{"key":"ref16","first-page":"30 583","article-title":"What can transformers learn in-context? a case study of simple function classes","volume":"35","author":"Garg","year":"2022","journal-title":"Advances in Neural Information Processing Systems"},{"article-title":"Scaling laws for neural language models","year":"2020","author":"Kaplan","key":"ref17"},{"key":"ref18","first-page":"80","volume-title":"The Fast Fourier Transform.","author":"Nussbaumer","year":"1981"}],"event":{"name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2024,11,3]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2024,11,6]]}},"container-title":["IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10904979\/10905066\/10905334.pdf?arnumber=10905334","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T05:18:49Z","timestamp":1741670329000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10905334\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,3]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iecon55916.2024.10905334","relation":{},"subject":[],"published":{"date-parts":[[2024,11,3]]}}}