{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T09:53:54Z","timestamp":1762509234972,"version":"build-2065373602"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,3]]},"DOI":"10.1109\/iecon55916.2024.10905602","type":"proceedings-article","created":{"date-parts":[[2025,3,10]],"date-time":"2025-03-10T13:32:07Z","timestamp":1741613527000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["New current analysis method for the diagnosis of gearbox faults under variable load and speed"],"prefix":"10.1109","author":[{"given":"Chaima Ben","family":"Abdallah","sequence":"first","affiliation":[{"name":"Université Jean Monnet Saint-Etienne IUT de Roanne,LASPI,Roanne,France"}]},{"given":"Mahfoud","family":"Bouzouidja","sequence":"additional","affiliation":[{"name":"Université Jean Monnet Saint-Etienne IUT de Roanne,LASPI,Roanne,France"}]},{"given":"Abdenour","family":"Soualhi","sequence":"additional","affiliation":[{"name":"Université Jean Monnet Saint-Etienne IUT de Roanne,LASPI,Roanne,France"}]},{"given":"Hubert","family":"Razik","sequence":"additional","affiliation":[{"name":"Ampère Université Claude Bernard,Villeuranne,France"}]},{"given":"Noureddine","family":"Zerhouni","sequence":"additional","affiliation":[{"name":"Université de Franche-Comté,Institut FEMTO-ST,Besaçon,France"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3341798"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3346512"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2021.3084615"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3338680"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3206754"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3285999"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2017.2690835"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110796"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.bspc.2021.102745"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111037"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s11634-023-00536-8"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICNSC58704.2023.10319051"}],"event":{"name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2024,11,3]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2024,11,6]]}},"container-title":["IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10904979\/10905066\/10905602.pdf?arnumber=10905602","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,3]],"date-time":"2025-10-03T04:09:10Z","timestamp":1759464550000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10905602\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iecon55916.2024.10905602","relation":{},"subject":[],"published":{"date-parts":[[2024,11,3]]}}}