{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T03:16:23Z","timestamp":1774322183474,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,3]]},"DOI":"10.1109\/iecon55916.2024.10905698","type":"proceedings-article","created":{"date-parts":[[2025,3,10]],"date-time":"2025-03-10T17:32:07Z","timestamp":1741627927000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Vision Transformer-based Approach for Solder Mask Fault Detection"],"prefix":"10.1109","author":[{"given":"Walter J. S.","family":"Viana","sequence":"first","affiliation":[{"name":"Univ. Federal do Amazonas (UFAM),Inst. of Exact Sciences and Tech. (ICET),Itacoatiara,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Neandra P.","family":"Ferreira","sequence":"additional","affiliation":[{"name":"Institute of Research and Technological Innovation (ICCT),Manaus,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sharlene S.","family":"Meireles","sequence":"additional","affiliation":[{"name":"Institute of Research and Technological Innovation (ICCT),Manaus,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mario","family":"Otani","sequence":"additional","affiliation":[{"name":"Institute of Research and Technological Innovation (ICCT),Manaus,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paulo L. J.","family":"Drews","sequence":"additional","affiliation":[{"name":"Univ. Federal do Rio Grande (FURG),Center for Computational Sciences (C3),Rio Grande,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Felipe G.","family":"Oliveira","sequence":"additional","affiliation":[{"name":"Univ. Federal do Amazonas (UFAM),Inst. of Exact Sciences and Tech. (ICET),Itacoatiara,Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3193183"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IECON49645.2022.9969094"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.5220\/0011357400003271"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICRTAC59277.2023.10480827"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IECON51785.2023.10312234"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IECON51785.2023.10312722"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.5220\/0010540800002994"},{"key":"ref8","article-title":"Detection of defect regions in solder mask peel off images using you-only-look-once convolutional neural network","author":"Heng","year":"2022"},{"key":"ref9","article-title":"Detec\u00e7\u00e3o autom\u00e1tica de microcomponentes smt ausentes em placas de circuito impresso","volume-title":"Workshop on Industry Applications (WIA) in the 29th Conference on Graphics, Patterns and Images (SIBGRAPI 2016)","volume":"1","author":"Rocha"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IECON43393.2020.9255234"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-021-00600-w"},{"key":"ref12","article-title":"An image is worth 16x16 words: Transformers for image recognition at scale","author":"Dosovitskiy","year":"2021"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2021.11.094"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-11018-5_35"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3093487"}],"event":{"name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","location":"Chicago, IL, USA","start":{"date-parts":[[2024,11,3]]},"end":{"date-parts":[[2024,11,6]]}},"container-title":["IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10904979\/10905066\/10905698.pdf?arnumber=10905698","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T05:23:29Z","timestamp":1741670609000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10905698\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,3]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/iecon55916.2024.10905698","relation":{},"subject":[],"published":{"date-parts":[[2024,11,3]]}}}