{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T23:32:02Z","timestamp":1777591922275,"version":"3.51.4"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,3]]},"DOI":"10.1109\/iecon55916.2024.10905837","type":"proceedings-article","created":{"date-parts":[[2025,3,10]],"date-time":"2025-03-10T17:32:07Z","timestamp":1741627927000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Cyber Attack Impact Characterization for IEC 61850-based Substations"],"prefix":"10.1109","author":[{"given":"Nazmus","family":"Saqib","sequence":"first","affiliation":[{"name":"Iowa State University,Ames,IA,50011"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Souradeep","family":"Bhattacharya","sequence":"additional","affiliation":[{"name":"Iowa State University,Ames,IA,50011"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Burhan","family":"Hyder","sequence":"additional","affiliation":[{"name":"Pacific Northwest National Laboratory,Richland,WA,99354"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manimaran","family":"Govindarasu","sequence":"additional","affiliation":[{"name":"Iowa State University,Ames,IA,50011"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2023.3305468"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PSCE.2006.296392"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2013.2294473"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.14236\/ewic\/ICS2016.7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISGT49243.2021.9372232"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/APPEEC.2016.7779741"},{"issue":"4","key":"ref7","first-page":"2021","article-title":"Vulnerability and impact analysis of the iec 61850 goose protocol in the smart grid","volume-title":"Sensors","volume":"21","author":"Reda"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MSCPES49613.2020.9133698"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2011.2159406"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3047341"},{"issue":"5","key":"ref11","article-title":"Machine learning-based intrusion detection for achieving cybersecurity in smart grids using iec 61850 goose messages","volume-title":"Symmetry","volume":"13","author":"Ustun","year":"2021"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2008.158"},{"key":"ref13","article-title":"Nistir 7628 revision 1, guidelines for smart grid cybersecurity","volume":"1","year":"2014"},{"key":"ref14","first-page":"1","article-title":"Ieee guide for physical security of electric power substations","year":"2021","journal-title":"IEEE Std 1402 - 2021 (Revision of IEEE Std 1402 - 2000)"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2956734"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM48719.2022.9916839"},{"key":"ref17","first-page":"22","article-title":"Dynamic voltage stability analysis in multi-machine power systems","volume-title":"15th Power System Computation Conference 2005 Liege, Belgium","author":"Cai"},{"key":"ref18","article-title":"Electric sector failure scenarios and impact analyses","volume-title":"National electric sector cybersecurity organization resource (NESCOR) technical working group","volume":"1","author":"Lee"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISGT.2016.7781277"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TD39804.2020.9299665"}],"event":{"name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","location":"Chicago, IL, USA","start":{"date-parts":[[2024,11,3]]},"end":{"date-parts":[[2024,11,6]]}},"container-title":["IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10904979\/10905066\/10905837.pdf?arnumber=10905837","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T05:12:40Z","timestamp":1741669960000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10905837\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,3]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iecon55916.2024.10905837","relation":{},"subject":[],"published":{"date-parts":[[2024,11,3]]}}}