{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,12]],"date-time":"2025-03-12T04:17:07Z","timestamp":1741753027852,"version":"3.38.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,3]],"date-time":"2024-11-03T00:00:00Z","timestamp":1730592000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007458","name":"Qatar Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007458","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,3]]},"DOI":"10.1109\/iecon55916.2024.10906043","type":"proceedings-article","created":{"date-parts":[[2025,3,10]],"date-time":"2025-03-10T17:32:07Z","timestamp":1741627927000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Quantification of Void Effects on High Voltage Power Cable Insulation Degradation"],"prefix":"10.1109","author":[{"given":"Hilal","family":"Al-Kuwari","sequence":"first","affiliation":[{"name":"Texas A&M University at Qatar,Doha,Qatar"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shady S.","family":"Refaat","sequence":"additional","affiliation":[{"name":"Texas A&M University at Qatar,Doha,Qatar"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohammad","family":"AlShaikh Saleh","sequence":"additional","affiliation":[{"name":"Texas A&M University at Qatar,Doha,Qatar"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3115519"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2019.008052"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2023.109287"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.3017951"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPERE56564.2023.10119586"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP50766.2021.9705437"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/WCNPS.2019.8896268"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1432\/1\/012024"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/en10121968"},{"key":"ref10","article-title":"Analysis of electric stress in High Voltage cables containing voids","volume":"3","author":"Patel","year":"2014","journal-title":"International Journal of Engineering Research and Technology"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.clet.2021.100390"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/en13205472"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.4314\/njtd.v20i3.1435"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PPC47928.2023.10310842"}],"event":{"name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2024,11,3]]},"location":"Chicago, IL, USA","end":{"date-parts":[[2024,11,6]]}},"container-title":["IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10904979\/10905066\/10906043.pdf?arnumber=10906043","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T05:22:47Z","timestamp":1741670567000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10906043\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iecon55916.2024.10906043","relation":{},"subject":[],"published":{"date-parts":[[2024,11,3]]}}}