{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:53:44Z","timestamp":1762498424719,"version":"build-2065373602"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,14]]},"DOI":"10.1109\/iecon58223.2025.11221162","type":"proceedings-article","created":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T18:48:46Z","timestamp":1762454926000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Improved Sliding Mode Based Demagnetization Fault Tolerant Control for IPMSM Drives"],"prefix":"10.1109","author":[{"given":"Runze","family":"Guo","sequence":"first","affiliation":[{"name":"Xi’an Jiaotong-Liverpool University,Department of Electrical and Electronic Engineering,Suzhou,P.R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aida","family":"Ye","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong-Liverpool University,Department of Electrical and Electronic Engineering,Suzhou,P.R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Suneel Kumar","family":"Kommuri","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong-Liverpool University,Department of Electrical and Electronic Engineering,Suzhou,P.R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3325571"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3355521"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3165283"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2023.3247402"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3245052"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3302935"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TFUZZ.2020.2999779"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2024.3381915"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050360"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2721883"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2023.3306157"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3425651"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3069787"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2010.2043258"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2895512"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2590993"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2023.3295403"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1137\/S0363012997321358"}],"event":{"name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2025,10,14]]},"location":"Madrid, Spain","end":{"date-parts":[[2025,10,17]]}},"container-title":["IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11220977\/11220985\/11221162.pdf?arnumber=11221162","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:48:46Z","timestamp":1762498126000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11221162\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,14]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iecon58223.2025.11221162","relation":{},"subject":[],"published":{"date-parts":[[2025,10,14]]}}}