{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:53:49Z","timestamp":1762498429935,"version":"build-2065373602"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000015","name":"U.S. Department of Energy","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000015","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,14]]},"DOI":"10.1109\/iecon58223.2025.11221333","type":"proceedings-article","created":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T18:48:46Z","timestamp":1762454926000},"page":"1-8","source":"Crossref","is-referenced-by-count":0,"title":["Impacts of Cyber-Physical Attacks in SST-GFMI-Based Microgrid"],"prefix":"10.1109","author":[{"given":"Debotrinya","family":"Sur","sequence":"first","affiliation":[{"name":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"}]},{"given":"Uzair","family":"Asif","sequence":"additional","affiliation":[{"name":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"}]},{"given":"Harsha V. R.","family":"Modugu","sequence":"additional","affiliation":[{"name":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"}]},{"given":"Luiz F. M.","family":"Arruda","sequence":"additional","affiliation":[{"name":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"}]},{"given":"Sudip K.","family":"Mazumder","sequence":"additional","affiliation":[{"name":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"}]},{"given":"Mohammad","family":"Shadmand","sequence":"additional","affiliation":[{"name":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/MIE.2020.3002523"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/ISIE54533.2024.10595728"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1049\/gtd2.12430"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/ACCESS.2020.3049023"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/JSYST.2023.3305757"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.3390\/electronics14020288"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ECCE55643.2024.10861622"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/IECON55916.2024.10905322"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/MPEL.2024.3491572"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/TSG.2023.3272632"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TPEL.2023.3292983"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.apenergy.2021.118054"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.3390\/electronics12040931"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1109\/ACCESS.2024.3518494"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.3390\/su13169423"},{"key":"ref16","article-title":"Solid-state power-conversion system","volume-title":"USPTO Patent","author":"Mazumder","year":"2023"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.measurement.2021.110686"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1016\/j.rineng.2024.102647"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/TPEL.2024.3391217"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/TPEL.2024.3477274"}],"event":{"name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2025,10,14]]},"location":"Madrid, Spain","end":{"date-parts":[[2025,10,17]]}},"container-title":["IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11220977\/11220985\/11221333.pdf?arnumber=11221333","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:48:53Z","timestamp":1762498133000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11221333\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,14]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iecon58223.2025.11221333","relation":{},"subject":[],"published":{"date-parts":[[2025,10,14]]}}}