{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:54:12Z","timestamp":1762498452863,"version":"build-2065373602"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,14]]},"DOI":"10.1109\/iecon58223.2025.11221559","type":"proceedings-article","created":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T18:48:46Z","timestamp":1762454926000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Multi-time-scale Ensemble Learning for Remaining Mileage\/Day Prediction of Electric Buses"],"prefix":"10.1109","author":[{"given":"Shilong","family":"Zhuo","sequence":"first","affiliation":[{"name":"Central South University,School of Computer Science and Engineering,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Heng","family":"Li","sequence":"additional","affiliation":[{"name":"Central South University,School of Electronic Information,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongcai","family":"Ma","sequence":"additional","affiliation":[{"name":"Central South University,School of Automation,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Wu","sequence":"additional","affiliation":[{"name":"Central South University,School of Electronic Information,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Jiang","sequence":"additional","affiliation":[{"name":"Central South University,School of Automation,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weirong","family":"Liu","sequence":"additional","affiliation":[{"name":"Central South University,School of Computer Science and Engineering,Changsha,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3330369"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyai.2025.100478"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIV.2018.2843126"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.trd.2024.104205"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3497993"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s13198-013-0195-0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2022.119624"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2021.3073052"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ensm.2023.102785"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s40031-024-01123-x"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2021.3080125"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICSSAS57918.2023.10331825"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2021.122454"}],"event":{"name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","start":{"date-parts":[[2025,10,14]]},"location":"Madrid, Spain","end":{"date-parts":[[2025,10,17]]}},"container-title":["IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11220977\/11220985\/11221559.pdf?arnumber=11221559","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:49:28Z","timestamp":1762498168000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11221559\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,14]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iecon58223.2025.11221559","relation":{},"subject":[],"published":{"date-parts":[[2025,10,14]]}}}