{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,2]],"date-time":"2026-07-02T04:06:55Z","timestamp":1782965215745,"version":"3.54.5"},"reference-count":10,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,14]],"date-time":"2025-10-14T00:00:00Z","timestamp":1760400000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,10,14]]},"DOI":"10.1109\/iecon58223.2025.11221744","type":"proceedings-article","created":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T18:48:46Z","timestamp":1762454926000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Fault-Tolerant Performance in Multi-Unit PMSMs Through Slot Geometry and Magnetic Decoupling"],"prefix":"10.1109","author":[{"given":"Yingnan","family":"Wang","sequence":"first","affiliation":[{"name":"Harbin Institute of Technology,School of Electrical Engineering and Automation,Harbin,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chengming","family":"Zhang","sequence":"additional","affiliation":[{"name":"Harbin Institute of Technology,School of Electrical Engineering and Automation,Harbin,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yingzhen","family":"Liu","sequence":"additional","affiliation":[{"name":"Harbin Institute of Technology,School of Electrical Engineering and Automation,Harbin,China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"David","family":"Gerada","sequence":"additional","affiliation":[{"name":"University of Nottingham,Department of Electrical and Electronic Engineering,Nottingham,UK"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fengyu","family":"Zhang","sequence":"additional","affiliation":[{"name":"University of Nottingham,Department of Electrical and Electronic Engineering,Nottingham,UK"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zeyuan","family":"Xu","sequence":"additional","affiliation":[{"name":"University of Nottingham,Department of Electrical and Electronic Engineering,Nottingham,UK"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3401462"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICEM60801.2024.10700157"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2969099"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3443926"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.4271\/2022-01-0055"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3032746"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2017.8002214"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2917031"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE47101.2021.9595489"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2956399"}],"event":{"name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","location":"Madrid, Spain","start":{"date-parts":[[2025,10,14]]},"end":{"date-parts":[[2025,10,17]]}},"container-title":["IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11220977\/11220985\/11221744.pdf?arnumber=11221744","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T06:52:34Z","timestamp":1762498354000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11221744\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10,14]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iecon58223.2025.11221744","relation":{},"subject":[],"published":{"date-parts":[[2025,10,14]]}}}