{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,23]],"date-time":"2024-08-23T21:03:05Z","timestamp":1724446985620},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/ieem.2015.7385750","type":"proceedings-article","created":{"date-parts":[[2016,5,7]],"date-time":"2016-05-07T09:44:45Z","timestamp":1462614285000},"source":"Crossref","is-referenced-by-count":8,"title":["Reliability modeling of successive release of software using NHPP"],"prefix":"10.1109","author":[{"given":"A.H.S.","family":"Garmabaki","sequence":"first","affiliation":[]},{"given":"A.","family":"Barabadi","sequence":"additional","affiliation":[]},{"given":"F.","family":"Yuan","sequence":"additional","affiliation":[]},{"given":"J.","family":"Lu","sequence":"additional","affiliation":[]},{"given":"Y.Z.","family":"Ayele","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","author":"musa","year":"1987","journal-title":"Software Reliability Measurement Prediction Application"},{"key":"ref11","author":"rahnani","year":"2009","journal-title":"Department of Defense\/Air Force Office of Scientific Research"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1080\/00207720802556245"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/WCSE.2010.149"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-13244-5_21"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221735"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICRESH.2010.5779595"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1142\/S021853931250012X"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1504\/IJPQM.2014.065556"},{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1007\/1-84628-295-0","author":"pham","year":"2006","journal-title":"System Reliability"},{"key":"ref3","article-title":"The Cat hedral & the Bazaar: Musings on linux and open source by an accidental revolutinary O'Reilly Media, Inc","author":"raymond","year":"2001"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539313400019"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-85729-204-9","author":"kapur","year":"2011","journal-title":"Software Reliabilty Assessment with or Applications"},{"key":"ref8","doi-asserted-by":"crossref","DOI":"10.1007\/978-0-85729-204-9","author":"kapur","year":"2011","journal-title":"Software Reliability Assessment with OR Applications"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1142\/S021853931250012X"},{"key":"ref2","article-title":"Handbook of Research on Open Sour ce Sof t ware-Technol ogi cal, Economic, and Soci al Perspect ives","author":"amant","year":"2009"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1046\/j.1365-2575.2001.00113.x"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s13198-011-0031-3"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(02)00071-7"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.04.005"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.5120\/2473-3327"}],"event":{"name":"2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","location":"Singapore, Singapore","start":{"date-parts":[[2015,12,6]]},"end":{"date-parts":[[2015,12,9]]}},"container-title":["2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7378213\/7385591\/07385750.pdf?arnumber=7385750","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,7]],"date-time":"2019-09-07T11:38:26Z","timestamp":1567856306000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7385750\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/ieem.2015.7385750","relation":{},"subject":[],"published":{"date-parts":[[2015,12]]}}}